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A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces
Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.
Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.
Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces
Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis
Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles
Assess functional performance with a full set of profile parameters developed by the automotive industry
Analyze surface evolution with respect to time, temperature, magnetic field or another dimension
Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles
Analyze or simulate aspheric surfaces and profiles and evaluate surface finish according to ISO 10110-8 in imaging systems, sensors and laser applications
Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)
FT-based texture analysis, advanced FT filtering, multi-scale analysis by wavelets
Freeform surface management, complex shape analysis, high quality 3D visualization
A metrological toolbox for shell data (freeform surfaces)
Efficiently and easily compare measured Shell data (actual) with CAD models (nominal) or generated meshes
Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.
3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)
Process spectral maps, correct and enhance spectral image data and perform correlative analysis
Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more
Full visualization & analysis of multi-channel cubes of compositional data
2nd generation lead (twist) analysis for the automotive industry
Colocalize and adjust surface and image data from one or several instrument types
