Surface analysis software trusted by the professionals

Seperate roughness and waviness components of surfaces using the latest ISO 16610 advanced filtering techniques.

Access ISO parameters including:

• 3D parameters defined in ISO 25178 including height (Sa, Sq, Ssk, Sku, Sz, etc.,) and functional (Smr, Smc, Sxp) parameters.
• ISO 4287 and new ISO 21290 primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.).

Calculate & display ASME B46.1 2D and 3D parameters (USA),  GB/T (China), DIN (Germany), JIS (Japan), NF (France), BSI (UK), UNE (Spain) and UNI (Italy) etc.

Perform functional analysis:

• Abbott-Firestone bearing ratio curve and depth distribution histogram.
• Subtraction of one surface from another (wear).
• Calculation of the material/void volume ratio and thickness of up to three vertical slices of a surface.

Normalize surfaces and remove artifacts prior to analysis.  Tools include:

• Leveling.
• Flipping in the horizontal or vertical axis.
• Rotation in one-degree increments.
• Zone extraction.
• Correction or removal of anomalous scan lines.
• Thresholding to remove spikes.
• Retouching of isolated artifacts
• Deconvolution to minimize tip impact on the measurement data.
• Filling in missing data points.
• Surface smoothing.
• Resampling to increase image resolution.

Perform fast and accurate analysis of surface geometry with tools for measuring:

• Distances.
• Angles.
• Areas of peaks and valleys.
• Volumes of bumps and holes.
• Step heights on surfaces and profiles.
• Coplanarity.

• Automatically stitch together multiple measurements that overlap on the horizontal plane, to increase the field of view.
• Interactively patch two or more surface measurements at different heights into a single surface ready for analysis, to increase vertical range.

• Extract a rectangular or non-rectangular zone.
• Remove a slice from a surface by thresholding.
• Automatically partition a surface into motifs (texture cells), then use the Partition and Level operator to extract a sub-surface and level it.

Once a sub-surface or region of interest has been extracted it can be analyzed in exactly the same way as a full surface – parameters are calculated on the sub-surface only. This makes it possible, for example, to study the roughness, flatness and coplanarity of planes on MEMS and mechanical and electronic components.

Shell visualization and analysis:

• Load, visualize and analyze freeform surfaces (shells) including STL, OBJ, PLY & 3MF files
• Analyze data produced by profilers with multiple scan axes
• Useful for applications where you need to see data from all angles (additive manufacturing, scans using X-ray tomography etc.)
• Extract an area of a shell and analyze it separately
• Extract surfaces and parametric profiles from shells

Perform metrological analysis on shells:

• Visualize surface curvature and deviation as colors in 3D
• Fit a reference form (plan, cylinder, sphere)
• Apply Gaussian-like filtering to calculate a smooth reference surface
• Calculate freeform surface texture parameters: height parameters, hybrid/spatial parameters, volume parameters

Compare measured Shells with CAD models:

• Pre-align models automatically or manually
• Fine-tune fitting
• Calculate and show deviations using user-defined color palettes
• Generate result Shell and deviations in order to carry out further analysis (surface texture analysis etc.)

• Extract a vertical (x,z) or horizontal (x,y) contour (profile) from a surface.
• Define nominal form using straightforward interactive tools to associate geometric elements with contours
• Calculate dimensions (including distances, radii, diameters and angles) using autodimensioning and interactive tools
• Compare measured contours with CAD data (DXF) or user-defined nominal form
• Specify tolerances including large positional tolerances if required
• Visualize form deviations easily with magnified graphics
• Automatically generate a table of results including pass/fail status
• Gothic arch analysis of bearings

Particle analysis

• Automatically detect and count grains, particles, islands, bumps, holes and motifs (texture cells) using multiple detection methods
• Sort particles into groups using several criteria
• Visualize classes graphically in real-time, create control charts, histograms, scatter plots etc

Fourier & wavelets analysis

• Frequency analysis – interactive frequency spectrum, interactive power spectrum density, autocorrelation and intercorrelation
• Calculate isotropy, directionality and periodicity – view dominant surface directions on a compass rose and calculate parameters
• Denoise surfaces using the FFT plot editor
• Discrete wavelet filtering (3D surfaces and 2D profiles) – visualize a surface or profile at multiple scale levels – select roughness and waviness scale levels
• Continuous wavelet decomposition – study scale levels and spatial locations where phenomena occur

4D analysis

• Combine a series of surfaces or converted images for 4D analysis with respect to time, temperature, magnetic field or another dimension
• Visualize surface, profile and point evolution, fly over a surface as it changes and record a movie for presentations
• Generate statistics on surface texture parameter evolution
• Filter out noise and highlight areas with different kinetic behavior using the Karhunen-Loève transform (principal component analysis)

Thickness Analysis

• Align any pair of surfaces or profiles to create a “thickness pair”
• Analyze thickness interactively between an upper layer and a lower layer
• Generate global thickness parameters: mean thickness, minimum/maximum, standard deviation, skewness, kurtosis etc.
• Read more

Fiber Analysis

• Quantify individual fibers whether they are separate, touching or overlapping.
• Detect fibers & interstices automatically using dedicated detection methods
• Display a histogram of fiber diameters
• Calculate fiber diameter (mean, min, max, standard deviation) and average fiber direction (fiber orientation)
• Read more

• Colocalize 3D surface topography data and images from different instruments (SEM, AFM etc.) to highlight surface features
• Overlay images on 3D topography (z axis in height units) or on pseudo-3D images (z axis in intensity units)
• Access a wide range of rendering options and set overlay transparency levels

Left: colocalization of an SEM image and an optical microscope image.