Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
François Blateyron, Digital Surf’s expert on surface metrology, examines the next big change in surface analysis: freeform surfaces.
R&W motifs (ISO 12085) are soon to be included in the revision of profile standards (ISO 21290). François Blateyron, Digital Surf’s surface metrology expert explains.
With the release of Mountains® 8 comes the possibility to load and visualize a new kind of data, known as “Shells” or “Freeform surfaces”. Christophe Mignot takes a closer look at this new data type.
Surface texture has always been a difficult discipline to master, due to complex filtration conditions and numerous parameters. ISO expert François Blateyron looks how this could be simplified in the future.
Sometimes objects in SEM images are quite complex and you may have trouble colorizing them. Learn how to adjust settings of the click and color tool to colorize complex objects in SEM images.
A whole new world of 3D awaits users of scanning electron microscopy (SEM) coupled with Mountains® software. Christophe Mignot, Digital Surf CEO and specialist in SEM image analysis, runs through one of the coolest techniques available for bringing to life even the tiniest details contained in images.
The Stereoscopic Reconstruction operator available in Mountains® enables users to obtain a precise 3D model from a stereoscopic pair of SEM images in just a few seconds. However, before running this operator, there are a few things you need to know.
Most surface texture parameters are related to heights. But in some applications lateral features and their spacing are as (if not more) important.