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⇒ Combine surface data from different instrument types including 3D optical profilers, atomic force microscopes, scanning tunneling microscopes, scanning electron microscopes, fluorescence, Raman, IR, EDX/EDS etc.

⇒ Colocalize images from different instruments /detectors.

⇒ Overlay images on 3D surface topography – view 3D overlays at any zoom level and angle.

Convert color and grayscale images into 3D colored pseudo-surfaces (Z-axis in intensity units).

⇒ Use colocalization with multi-channel data. For example, AFM data comprising numerous signals (height, phase etc.) can be overlaid with data measured using another instrument type (scanning electron microscopy, spectroscopy etc.)

Generate dynamic images or extract a multi-channel dataset from the results of your colocalization.