⇒ Combine surface data from different instrument types including 3D optical profilers & AFM, STM, SEM, fluorescence, Raman, IR & other microscopes.
⇒ Colocalize images from different instruments /detectors.
⇒ Overlay images on 3D surface topography – view 3D overlays at any zoom level and angle.
⇒ Convert color and grayscale images into 3D colored pseudo-surfaces (Z-axis in intensity units).