⇒ Combine surface data from different instrument types including 3D optical profilers, atomic force microscopes, scanning tunneling microscopes, scanning electron microscopes, fluorescence, Raman, IR, EDX/EDS etc.
⇒ Colocalize images from different instruments /detectors.
⇒ Overlay images on 3D surface topography – view 3D overlays at any zoom level and angle.
⇒ Convert color and grayscale images into 3D colored pseudo-surfaces (Z-axis in intensity units).
⇒ Use colocalization with multi-channel data. For example, AFM data comprising numerous signals (height, phase etc.) can be overlaid with data measured using another instrument type (scanning electron microscopy, spectroscopy etc.)
⇒ Generate dynamic images or extract a multi-channel dataset from the results of your colocalization.