Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Learn more about 3D topographic reconstruction from SEM images using Mountains® software in our coming webinar.
We would be pleased to welcome you to our booth #115 at the next SciX Conference taking place in Raleigh, NC from October 22 to 24.
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 22,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
In the realm of dental implantology, understanding bacterial adhesion mechanisms is essential. Recent research led by Steve Papa and fellow researchers at the Jean Monnet University in Saint-Étienne, France, revealed the intricate relationship between surface topography and bacterial adhesion, with a particular focus on Porphyromonas gingivalis, a bacterium closely associated with dental implant failure.
Dr. Mugino O. Kubo Ph.D at the University of Tokyo, Japan speaks about how her team are using three-dimensional microwear analysis and implementing new methods for studying the paleodiet of carnivorous dinosaurs, including the iconic Tyrannosaurus rex.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
The goal of this article is to highlight AFM image processing methods and analysis techniques including particle analysis (grain analysis), roughness analysis and force curve analysis and examine their fields of application.
