MountainsMap® is dedicated surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers.
MountainsMap® SEM is dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) including tools for colorization and particle analysis
Since SPM specialists Image Metrology and Digital Surf joined forces, development teams from both companies have been working hard to create the next generation of SPM image analysis software.
Meet Digital Surf experts on the EU-Japan Centre booth at the Nano Tech Exhibition & Conference, the World’s largest event for nanotechnologies, from January 29 to February 1 in Tokyo, Japan.
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides MountainsMap® software packages directly to instrument users. Mountains® has an installed base of 12,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
A French car manufacturer performed quality control of automotive dashboard material (plastic). Measured data was checked to be in compliance with ISO 25178 parameters.
Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
Surface texture has always been a difficult discipline to master, due to complex filtration conditions and numerous parameters. ISO expert François Blateyron looks how this could be simplified in the future.