MountainsLab® software is the ultimate, industry-standard surface analysis suite and point of confluence for data from any kind of surface measuring instrument, the ideal solution for labs working with different types of microscopes and profilers.
MountainsSPIP® is dedicated imaging and analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM), STM, MFM, SNOM, CSAFM, KPFM, etc.
Check out what’s inside Mountains® 8, the next generation of our surface imaging, analysis and metrology software.
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 15,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
Ultrashort femtosecond lasers are known for their capacity to efficiently fabricate complex nanostructures and devices for a wide variety of applications. In two recent studies, the properties of femtosecond laser-structured surfaces were revealed thanks to a unique SEM image reconstruction technique.
Bioceramics are particularly useful in the repair and reconstruction of bone. A group of researchers at the University of Limoges investigated the impact of bioceramic surface topography and composition on protein adhesion forces.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
R&W motifs (ISO 12085) are soon to be included in the revision of profile standards (ISO 21290). François Blateyron, Digital Surf’s surface metrology expert explains.
