MountainsMap® is dedicated surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers.
MountainsMap® SEM is dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) including tools for colorization and particle analysis
We recently launched a new visual identity. Watch the video to find out the story behind this new design.
Meet Digital Surf experts on booth #716 during the next MRS Fall Meeting & Exhibit from November 27 to 30 in Boston, MA, USA.
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides MountainsMap® software packages directly to instrument users. Mountains® has an installed base of 12,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.
Pyramid-shaped solar cells are particularly effective for converting energy from the sun into usable energy without the problem of overheating. In a study on solar cell performance enhancement, industrial researchers used MountainsMap® to visualize surface topography in 3D and overlay a color image of solar cells on topography.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
Most surface texture parameters are related to heights. But in some applications lateral features and their spacing are as (if not more) important.