Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Mountains® 9 is now available! Watch the launch video and discover all the exciting new features of this next major version of Mountains® software!
The 2021 Microscopy and Microanalysis conference will be held virtually from August 1 to 5. We’ll be there with Mountains® 9!
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 20,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.
The profilometer manufacturer Nanovea conducted a study of different pharmaceutical tablets in order to study their surface roughness. With the use of a profilometer, they measured the average surface roughness of three different tablet surfaces. The data obtained was then analyzed with Nanovea’s Professional 3D software based on Mountains® technology.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
Surface texture specifications are indicated using the root symbol. The new ISO 21920-1 series will soon bring changes that may modify common practices. Our senior metrology expert explains.
