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MountainsLab® for multi-instrument compatibility

Ultimate surface analysis suite and point of confluence for data from any kind of instrument, the ideal solution for labs working with multiple types of microscopes

MountainsMap® for Profilometry

Surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers

MountainsSEM® for Scanning Electron Microscopy

3D reconstruction, image enhancement and metrology software for scanning electron microscopes (SEM) including tools for colorization and particle analysis

MountainsSPIP® for Scanning Probe Microscopy

Analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM) and STM, MFM, SNOM, CSAFM, KPFM, etc.

MountainsSpectral® for Spectroscopy

Correlative analysis software for spectroscopic techniques including Raman, FT-IR, fluorescence, photoluminescence, cathodoluminescence and EDX/EDS

News

April 19, 2021

Be sure to register for our upcoming webinar to get an exclusive first look at the new features coming in version 9, the new major version of Mountains® software.

Event

01 August

The 2021 Microscopy and Microanalysis conference will be held virtually from August 1 to 5. Come along and get a full presentation of Mountains® 9 new features for your SEM image analysis.

Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989

Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.

Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 20,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.

Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.

Stories

Correlating AFM, SEM & EDX data for nanoparticle analysis

For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.

3D profilometry for quality control of pharmaceutical tablets

The profilometer manufacturer Nanovea conducted a study of different pharmaceutical tablets in order to study their surface roughness. With the use of a profilometer, they measured the average surface roughness of three different tablet surfaces. The data obtained was then analyzed with Nanovea’s Professional 3D software based on Mountains® technology.

Learn surface metrology

Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters

Blog

How is surface texture indicated on drawings?

Surface texture specifications are indicated using the root symbol. The new ISO 21920-1 series will soon bring several changes that may modify common practices. Digital Surf’s senior metrology expert François Blateyron explains.