Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Mountains® 8 is the next generation
of surface and image analysis software
for profilers and microscopes.
Mountains® software makes analyzing
data from any profiler or microscope
quick, intuitive & traceable.
Mountains® software is compatible
with all scanning probe
Mountains® software provides tools
for colorization, 3D reconstruction,
particle analysis & more.
Mountains® provides several feature detection methods and classification tools dedicated to particle analysis. Mathieu Cognard, product manager at Digital Surf, gives us a guided tour.
Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.
Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 20,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.
Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.
Ultrashort femtosecond lasers are known for their capacity to efficiently fabricate complex nanostructures and devices for a wide variety of applications. In two recent studies, the properties of femtosecond laser-structured surfaces were revealed thanks to a unique SEM image reconstruction technique.
Researchers in tissue engineering & biophotonics at King’s College London (UK) seeking to attain better understanding of tooth enamel erosion recently applied its methods to bring to light micro-scale surface changes over time.
Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters
When results differ, which ones can be trusted? Proving that an algorithm is correct is not so straightforward. François Blateyron, senior expert on surface metrology, discusses this complex issue.