MountainsMap® image analysis software for scanning probe microscope

Highlights

Compatible with all scanning probe microscopy techniques including atomic force microscopy (AFM), STM, MFM, SNOM, CSAFM, KPFM, etc.

See everything that you measure - real time visualization of 3D surface topography and multi-channel image overlays

Get your data ready for analysis - enhance your data with correction, normalization & denoising operators. Remove anomalous scan lines and isolated artifacts.

Analyze force volume: visualize and analyze force curves, calculate parameter maps & study correlation with topography

Study grains & particles: analyze grains and texture cells, detect motifs using advanced segmentation, calculate morphological parameters & generate statistics

Co-localize data - combine data from multiple instruments and perform correlative analysis of your materials

Key features

Mountains® is easy-to-use

Smart user environment with logical top-down organization of all functions and contextual ribbons
Work in a choice of 11 languages (EN, FR, DE, ES, IT, PL, BR, JP, CN, KR, RU)
Complete reference guide (EN, FR, DE, JP) with illustrations and examples accessible simply by pressing the F1 key

Mountains® turns your surface data into accurate, visual surface analysis reports

Turn micro and nano surface data into a metrology report at the click of a button
Publish data in PDF, Word® and Excel® formats
Export high resolution images and pages

Mountains® helps you work fast and keep track of your work

Save time and increase productivity in your data analysis processes
Access powerful automation tools (Templates, Minidocs)
Fine-tune each analysis step at any time using Mountains® unique hierarchical workflow

Mountains® contains the latest tools for characterizing surfaces in accordance with metrology standards

Characterize data in accordance with the latest surface texture parameters defined in ISO standards, ASME B46.1 (USA) standards and other national standards
Apply advanced filtering techniques and calculate parameters
Study surface texture, geometry and morphology

Mountains® allows you to visualize your data in high quality real-time 3D

See every feature of your data
Create stunning overlays of images and topography
Generate animated views

Mountains® is compatible with any surface measuring instrument including:

3D Optical Profilers, 3D Scanning Profilometers, 2D Profilometers
SEM – Scanning Electron Microscopes
SPM – Scanning Probe Microscope
Raman/FTIR Spectrometers
You can also combine data from several different instruments.

Mountains® can analyze multiple types of micro and nano data

Profiles (2D) & series of profiles - Surfaces (topography) & series of surfaces
Multi-channel data (multilayer images, topography + image etc.)
Images (true color or grayscale) & series of images
Force curves, series of force curves & force volume
Spectrum, hyperspectral cube & more

Select your product

MountainsMap® SPM

Imaging & analysis software for scanning probe microscopes.

Compatible with AFM, STM, CSAFM, KPFM, MFM, NSOM and other techniques

Product PDF

MountainsMap® Premium

High-end software solution for all types of surface measuring instruments.

Ideal for labs working with several different instruments

Product PDF

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsMap SPM range.

AFM Force Curves

AFM force curve analysis, adhesion point detection, WLC models & statistics

3D Advanced Surface Texture

Advanced studies, parameters & filters for roughness analysis

Contour Analysis

Geometric dimensioning of contour profiles and horizontal contours extracted from images

Grains & Particles

Multiple complementary methods for analyzing grains, particles, islands and surface morphology

Stories

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.

Semiconductors: characterizing 3D structures at the nanoscale

Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.

Failure analysis in optoelectronic devices

Quantitative cathodoluminescence technology coupled with the power of Mountains® software made it possible to localize and identify degraded layers in state-of-the-art green laser diodes.

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.

Testimonials

What People Are Saying

Dr. Sergei Magonov

AFM expert, SPM Labs LLC.

I myself have enjoyed working with Mountains® for a number of years. In my opinion, it is essential that AFM users work with specialized software packages such as those based on Digital Surf’s Mountains® platform.

Dr Angel Perez

Research scientist, Barcelona Institut of Material Science

We use several different kinds of instruments to characterize our samples. Mountains® provides multiple instrument compatibility and is able to deal with a wide variety of scientific analysis procedures

30-day free trial

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