AFM Force Curves
AFM force curve analysis, adhesion point detection, WLC models & statistics
Imaging & analysis software for scanning probe microscopes.
High-end software solution for all types of surface measuring instruments.
The following range of optional modules for advanced and specialized applications is available for MountainsMap SPM range.
Geometric dimensioning of contour profiles and horizontal contours extracted from images
During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.
The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.
Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.
Quantitative cathodoluminescence technology coupled with the power of Mountains® software made it possible to localize and identify degraded layers in state-of-the-art green laser diodes.
AFM expert, SPM Labs LLC.
I myself have enjoyed working with Mountains® for a number of years. In my opinion, it is essential that AFM users work with specialized software packages such as those based on Digital Surf’s Mountains® platform.
Research scientist, Barcelona Institut of Material Science
We use several different kinds of instruments to characterize our samples. Mountains® provides multiple instrument compatibility and is able to deal with a wide variety of scientific analysis procedures