The #1 toolbox for Scanning Probe Microscopy data analysis

Based on industry-standard Mountains® technology and now also including all the best SPIP™ (Image Metrology) interactivity and analytical tools, MountainsSPIP® software contains the most advanced set of professional tools on the market for your scanning probe microscopy image analysis.
Apply interactive particle analysis - Analyze force curves and force volume images - Perform correlative analysis by combining SPM images and data from other instruments - Analyze multi-channel files - Process data from ANY scanning probe microscope including atomic force microscopes (AFM) - Correct, normalize and denoise measured data - Ensure correct XY calibration - Correct tip effect - Characterize surface texture in accordance with ISO standards

What’s inside MountainsSPIP®

Advanced particle analysis

Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.

Force spectroscopy

View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.

Correlative analysis

Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.

Multi-channel imaging & analysis

Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.

High compatibility

Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.

Data correction & normalization

Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.

Lateral calibration

Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.

Tip deconvolution

Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.

Surface texture analysis

Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.

Benefits

Thanks to its unique analysis workflow, MountainsSPIP® makes it easy to keep track of analysis steps already applied to images and instantly revert back to any step in the process. Any step can be edited: all dependent steps are automatically recalculated!

Benefits

MountainsSPIP® allows you to save work and pick up where you left off next time. Repetitive analysis routines, following the same steps again and again, can be automated with robust tools including templates.

Benefits

Organize your SPM image analysis (original images, particle analysis, statistics, force curve analysis etc.) on multiple pages and publish directly in different formats (PDF, Word and Excel). Ideal for sharing your work with colleagues, students, clients etc.

Benefits

Join our worldwide community of over 15,000 Mountains® users and choose the surface and image analysis software trusted by the leading manufacturers of microscopes and profilometers.

Benefits

Work in one of 11 languages and get help and responsive support on using MountainsSPIP® for SPM applications from our international team of experts.

Benefits

Rely on Digital Surf’s extensive experience in developing analysis software for the global industrial and scientific community. The majority of national research laboratories trust the precision of Mountains®.

Select your product

	MountainsSPIP® Premium	MountainsSPIP® Expert	MountainsSPIP® Starter
Instrument compatibility	Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.
3D View with animation
Advanced File Explorer
Analysis of force curves
Automation using Template Documents and document save/load features
Basic tools for SPM image visualization and analysis
Colocalization (correlative analysis)
Detection, analysis and classification of particles and pores
Dimensional measurements (step heights, distances)
Full reporting facilities including PDF and Word export
Image stitching
Powerful statistical tools
Tip deconvolution

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Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP^® range.

Profiler Extension Module

Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques

SEM Topography Module

3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization

4D Series Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Statistics Module

Automate statistical analysis of multiple data population types and study process capability

Stories

Correlating AFM, SEM & EDX data for nanoparticle analysis

For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.

Exploring hyperspectral maps of 2D materials

Tailoring 2D semiconductor heterostructures with specific bandgaps is a key aspect of leveraging new quantum materials for electronics and optoelectronics, one of the hot topics for researchers currently working in nanotech. Craig Wall, applications scientist at Montana Instruments, recently investigated the subject using Mountains® software to analyze results from Raman spectroscopy and photoluminescence.

Analyzing photoelectron spectroscopic measurements

Scientists from the ISEN (Institut Supérieur de l’Électronique et du Numérique) in Lille, France, used photoelectron spectroscopy to investigate a new method for growing PbS nanoplatelets on InP surfaces.

Characterizing the silicon dangling bond

Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.

Toward improved integration of bioceramic implants

Bioceramics are particularly useful in the repair and reconstruction of bone. A group of researchers at the University of Limoges investigated the impact of bioceramic surface topography and composition on protein adhesion forces.

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.

Semiconductors: characterizing 3D structures at the nanoscale

Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.

Testimonials

What People Are Saying

Dalia Yablon

Founder of SurfaceChar LLC

I have really enjoyed working with MountainSPIP and taking advantage of its powerful features. While it does take some time to learn, this software package builds on the success of SPIP Image Metrology to deliver everything we are used to and more. Some of my favorite new capabilities including the ability to save a workflow, improved image visualization and versatile and easy-to-use particle sizing. Well worth the time investment to master this powerful and useful software!

Dr. Sergei Magonov

AFM expert, SPM Labs LLC.

I myself have enjoyed working with Mountains® for a number of years. In my opinion, it is essential that AFM users work with specialized software packages such as those based on Digital Surf’s Mountains® platform.

Dr Angel Perez

Research scientist, Barcelona Institut of Material Science

We use several different kinds of instruments to characterize our samples. Mountains® provides multiple instrument compatibility and is able to deal with a wide variety of scientific analysis procedures

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