What’s inside MountainsSPIP®

Advanced particle analysis
Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.
Force spectroscopy
View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.
Correlative analysis
Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
Multi-channel imaging & analysis
Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.
High compatibility
Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.
Data correction & normalization
Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.
Lateral calibration
Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.
Tip deconvolution
Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.
Surface texture analysis
Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.

Benefits

Thanks to its unique analysis workflow, MountainsSPIP® makes it easy to keep track of analysis steps already applied to images and instantly revert back to any step in the process. Any step can be edited: all dependent steps are automatically recalculated!

Benefits

MountainsSPIP® allows you to save work and pick up where you left off next time. Repetitive analysis routines, following the same steps again and again, can be automated with robust tools including templates.

Benefits

Organize your SPM image analysis (original images, particle analysis, statistics, force curve analysis etc.) on multiple pages and publish directly in different formats (PDF, Word and Excel). Ideal for sharing your work with colleagues, students, clients etc.

Benefits

Join our worldwide community of over 15,000 Mountains® users and choose the surface and image analysis software trusted by the leading manufacturers of microscopes and profilometers.

Benefits

Work in one of 11 languages and get help and responsive support on using MountainsSPIP® for SPM applications from our international team of experts.

Benefits

Rely on Digital Surf’s extensive experience in developing analysis software for the global industrial and scientific community. The majority of national research laboratories trust the precision of Mountains®.

Select your product

MountainsSPIP® Starter MountainsSPIP® Expert MountainsSPIP® Premium
Instrument compatibility Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.
3D View with animation
Advanced File Explorer
Automation using Template Documents and document save/load features
Basic tools for SPM image visualization and analysis
Full reporting facilities including PDF and Word export
Detection, analysis and classification of particles and pores
Dimensional measurements (step heights, distances)
Image stitching
Tip deconvolution
Analysis of force curves
Colocalization (correlative analysis)
Powerful statistical tools
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Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.

Contour

Basic geometric dimensioning & tolerancing of contour profiles and horizontal contours extracted from images
Spectroscopy

Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.
Force Curve Analysis

Analyze data collected by force spectroscopy: force curves (force-distance curves), series of curves and force volume images (data cubes). Measure adhesion events, nanoindentation and fit worm-like chain (WLC) models.
Profiler extension

Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques
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Stories

Applications

Analyzing photoelectron spectroscopic measurements

Scientists from the ISEN (Institut Supérieur de l’Électronique et du Numérique) in Lille, France, used photoelectron spectroscopy to investigate a new method for growing PbS nanoplatelets on InP surfaces.
Applications

Toward improved integration of bioceramic implants

Bioceramics are particularly useful in the repair and reconstruction of bone. A group of researchers at the University of Limoges investigated the impact of bioceramic surface topography and composition on protein adhesion forces.

Applications

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.
Applications

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.
Applications

Characterizing the silicon dangling bond

Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.
Applications

Semiconductors: characterizing 3D structures at the nanoscale

Nanolithography is a precise patterning technology used to fabricate functional nanostructures for applications in biosensors, advanced materials and extensively in the semiconductor sector for solar cells, printed electronics, LED, MEMS, etc.
Applications

Failure analysis in optoelectronic devices

Quantitative cathodoluminescence technology coupled with the power of Mountains® software made it possible to localize and identify degraded layers in state-of-the-art green laser diodes.
Applications

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.
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Testimonials

What People Are Saying

Dr. Sergei Magonov

Dr. Sergei Magonov

AFM expert, SPM Labs LLC.

I myself have enjoyed working with Mountains® for a number of years. In my opinion, it is essential that AFM users work with specialized software packages such as those based on Digital Surf’s Mountains® platform.

Dr Angel Perez

Dr Angel Perez

Research scientist, Barcelona Institut of Material Science

We use several different kinds of instruments to characterize our samples. Mountains® provides multiple instrument compatibility and is able to deal with a wide variety of scientific analysis procedures

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