Compatible with all scanning probe microscopy techniques including atomic force microscopy (AFM), STM, MFM, SNOM, CSAFM, KPFM, etc.
Get your data ready for analysis with correction, normalization & denoising operators. Remove anomalous scan lines and isolated artifacts.
Force spectroscopy: force curve and force volume image analysis. Detect adhesion force, apply Wormlike chain models for protein unfolding, generate Young’s Modulus map etc.
Particle analysis: analyze grains, particles, pores and texture cells, detect motifs using advanced segmentation, calculate morphological parameters & generate statistics
Correlative analysis - combine data from multiple instruments and perform colocalization automatically
See everything that you measure - real time visualization of 3D surface topography and multi-channel image overlays

Key features

Select your product

MountainsMap® SPM

Imaging & analysis software for scanning probe microscopes.

  • Compatible with AFM, STM, CSAFM, KPFM, MFM, NSOM and other techniques

MountainsMap® Premium

High-end software solution for all types of surface measuring instruments.

  • Ideal for labs working with several different instruments



What People Are Saying

30-day free trial

Free trial

Ready to try MountainsMap®?

Scroll Up