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What’s inside MountainsSPIP®

Advanced particle analysis

Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.

Force spectroscopy

View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.

Correlative analysis

Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.

Multi-channel imaging & analysis

Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.

High compatibility

Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.

Data correction & normalization

Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.

Lateral calibration

Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.

Tip deconvolution

Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.

Surface texture analysis

Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.

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Instrument compatibility

Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.

Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.

Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc.

3D View with animation

Advanced File Explorer

Automation using Template Documents and document save/load features

Basic tools for SPM image visualization and analysis

Dimensional measurements (step heights, distances)

Full reporting facilities including PDF and Word export

Detection, analysis and classification of particles and pores

Powerful statistical tools

Tip deconvolution

Analysis of force curves

Colocalization (correlative analysis)

Image stitching

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.

IV Spectroscopy Module

Analysis and 3D visualization of IV spectroscopy images and individual IV curve analysis (including CITS data)

Profiler Extension Module

Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques

Spectroscopy Module

Visualize, analyze and correlate data obtained using spectroscopy techniques: IR, Raman/TERS, EDS/EDX/XRF, cathodoluminescence and more

SEM Topography Module

3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization

SPM Extension Module

Read AFM/SPM file formats, work with multi-channel SPM images, correct data acquisition errors

Colocalization Module

Colocalize data from different instrument types and carry out correlative studies

Force Curve Analysis Module

Analyze data collected by force spectroscopy: force curves (force-distance curves), series of curves and force volume images (data cubes). Measure adhesion events, nanoindentation and fit worm-like chain (WLC) models.

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles and horizontal contours extracted from images, surfaces etc.

4D Series Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Statistics Module

Automate statistical analysis of multiple data population types and study process capability

Particle Analysis Module

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

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Try Mountains®8 software for free (Mountains®9 available early June)