Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Advanced particle analysis
Force spectroscopy
Correlative analysis
Left: colocalization of an SEM image with AFM topography.
Multi-channel imaging & analysis
Scanning probe microscopes commonly image several interactions simultaneously. Through their different modes, SPMs produce multiple datasets at the same location on the sample (topography, conductivity or stiffness for example).
Learn more: www.digitalsurf.com/news/multi-channel-data-how-to-study-correlations/
High compatibility
Data correction & normalization
Correction of anomalous scan lines and measurement artifacts
Normalization
Denoising filters
Lattice & lateral calibration
Tip deconvolution
Correct the effect of the tip on the measured surface.
Surface texture analysis
![]() |
![]() |
![]() |
|
---|---|---|---|
Instrument compatibility |
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc. |
||
3D views with animation |
|||
Advanced File Explorer |
|||
Automation (template documents and document save/load features) |
|||
Basic correction tools (level, correct lines etc.) |
|||
Essential 2D & 3D parameters and filters |
|||
Dimensional measurements (step heights, distances etc.) |
|||
Full reporting facilities including PDF and Word export |
|||
Detection, analysis and classification of particles and pores |
|||
Full set of statistical tools |
|||
Tip deconvolution |
|||
Force curve analysis |
|||
IV Spectroscopy |
|||
Colocalization (correlative analysis) |
|||
Image stitching |
The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.