Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.
Advanced particle analysis
Easily detect and quantify features of any shape and size. Quantify 70+ characteristics (height, area, volume, perimeter etc.) for the whole sample or individual particles.
View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.
Force spectroscopy
View, process and analyze force curves and force volume images. Correct data, create interactive parameter maps and manage large collections of curves.
Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
Correlative analysis
Combine SPM images with data from other instruments (SEMs, 3D optical microscopes, confocal microsopes etc.) to perform correlative analysis.
Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.
Multi-channel imaging & analysis
Handle multi-channel files. Visualize different layers in 3D at the touch of a button. Apply analysis to a single layer or to all layers. Extract multi-layer cross-sections.
Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.
High compatibility
Process data from any brand or type of scanning probe microscope including atomic force microscopy (AFM), STM, SNOM etc. Open over 170 file formats.
Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.
Data correction & normalization
Get your data ready for analysis with correction, normalization & denoising tools. Remove anomalous scan lines and isolated artifacts.
Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.
Lateral calibration
Lateral calibration: automatically calculate correction parameters (for example using a calibration standard) then apply them to measured data.
Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.
Tip deconvolution
Correct image distortion due to tip convolution. Simulate and reconstruct tip geometry and re-use it for the deconvolution of other measured data.
Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.
Surface texture analysis
Characterize surface texture characterization in accordance with international standards. Apply advanced ISO 16610 filtering techniques and ISO 25178 3D parameters.
MountainsSPIP® Premium
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MountainsSPIP® Expert
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MountainsSPIP® Starter
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Instrument compatibility |
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc. |
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc. |
Any scanning probe microscope (SPM) including atomic force microscopy (AFM), STM, SNOM etc. |
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3D View with animation |
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Advanced File Explorer |
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Automation using Template Documents and document save/load features |
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Basic tools for SPM image visualization and analysis |
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Dimensional measurements (step heights, distances) |
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Full reporting facilities including PDF and Word export |
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Detection, analysis and classification of particles and pores |
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Powerful statistical tools |
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Tip deconvolution |
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Analysis of force curves |
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Colocalization (correlative analysis) |
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Image stitching |
The following range of optional modules for advanced and specialized applications is available for MountainsSPIP® range.
Luxembourg Institue of Science and Technology (LIST)
I’ve started transitioning to MountainsSPIP® thanks to your highly instructive webinars[…] once you start to get to know the software, it’s very pleasant to use.
Founder of SurfaceChar LLC
I have really enjoyed working with MountainSPIP® and taking advantage of its powerful features. While it does take some time to learn, this software package builds on the success of SPIP Image Metrology to deliver everything we are used to and more. Some of my favorite new capabilities including the ability to save a workflow, improved image visualization and versatile and easy-to-use particle sizing. Well worth the time investment to master this powerful and useful software!
AFM expert, SPM Labs LLC.
I myself have enjoyed working with Mountains® for a number of years. In my opinion, it is essential that AFM users work with specialized software packages such as those based on Digital Surf’s Mountains® platform.
Research scientist, Barcelona Institut of Material Science
We use several different kinds of instruments to characterize our samples. Mountains® provides multiple instrument compatibility and is able to deal with a wide variety of scientific analysis procedures
