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What’s inside MountainsLab®

Data confluence
  • Bring together data from multiple instruments (profilometer, microscope)
  • Speed up analysis
  • Load any document created by other Mountains® users
  • Process data from virtually any type of surface and image analysis instrument
Compatible with any instrument
  • Process data from profilometers, light microscopes, scanning electron microscopes (SEM), scanning probe microscopes (SPM) and spectroscopic techniques
  • Load hundreds of file formats
Correlative analysis
  • Perform correlative analysis
  • Use the  colocalization feature to combine and overlay data from different instruments
  • Access advanced rendering options
Surface texture analysis
  • Benefit from Digital Surf’s expertise in surface metrology
  • Analyze surface texture
  • Access advanced filters and parameters
Advanced particle & fiber analysis
  • Detect and quantify particles and fibers on any surface
  • Benefit from application-oriented segmentation techniques
  • Group particles into classes based on characteristics
  • Generate statistics and graphics
Generate statistics
  • Generate statistics for static or dynamic data populations
  • Create statistics reports
  • Let MountainsLab® detect and update data automatically
  • Graphically display data
Advanced contour analysis
  • Automatically generate dimensions of profiles
  • Compare profiles with CAD data or nominal form
  • Graphically display form deviations
Force spectroscopy
  • Analyze force curves and force volume
  • Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.
Data processing for spectroscopic techniques
  • Visualize and analyze spectra, spectral maps and hyperspectral images
  • Correlate data from spectroscopy with data and images from other instruments
  • Load multi-channel cubes of compositional data
SEM image colorization
  • Add color to objects in SEM images in just a few clicks
  • Automatic object detection
  • Save time compared with using photo editing software
3D SEM image reconstruction
  • Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector, all in a matter of seconds
Learn & teach
  • Access tutorials and ready-to-use templates adapted to each different instrument type
  • Teach new colleagues about surface and image analysis routines using templates

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    MountainsLab® Premium

    MountainsLab® Expert

    Instrument compatibility

    All types of surface measuring and imaging instrument: 2D/3D profilometer, light microscope, scanning electron microscopes, scanning probe microscopes, spectrometer etc.

    Key features

    Roughness and waviness analysis on profiles and surfaces

    SEM image colorization & 3D reconstruction from stereo or quad SEM images

    Correction tools, parameters and filters for SPM image analysis

    Spectral map processing & spectral image correction & enhancement

    Correction measurement & filtering tools for images from light microscopy & other techniques

    Statistical analysis of static and dynamic populations

    Optional modules

    Advanced profile analysis

    Automotive profile parameters

    Advanced topography analysis

    Particle analysis

    Correlative analysis


    Contour analysis


    Advanced contour analysis including CAD compare


    Fourier & wavelets analysis


    Fiber analysis of images & topography


    Lens analysis


    Force curve and force volume analysis


    IV Spectroscopy


    Thickness analysis


    4D surface change analysis


    Chemical cubes


    Support for Shells (freeform surfaces)


    Shell Topography for metrological analysis


    Shell CAD compare

    Option Option

    Scale-sensitive fractal analysis

    Option Option

    Lead analysis (Twist)

    Option Option
    Available as an option
    Not compatible

    Recommended optional modules

    The following range of optional modules for advanced and specialized applications is available for MountainsLab®.

    Shell Extension Module

    Freeform surface management, complex shape analysis, high quality 3D visualization

    Shell Topography Module

    A metrological toolbox for shell data (freeform surfaces)

    IV Spectroscopy Module

    3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

    Chemical Cubes Module

    Full visualization & analysis of multi-channel cubes of compositional data

    Scale-sensitive Analysis Module

    Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)

    Force Curve Analysis Module

    Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

    Lead Analysis (Twist) Module

    2nd generation lead (twist) analysis for the automotive industry

    Contour Analysis Module

    Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

    Advanced Contour Analysis Module

    Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

    4D Surface Change Module

    Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

    Fourier & Wavelets Module

    FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

    Thickness Analysis Module

    Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles

    Fiber Analysis Module

    Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

    Lens Analysis Module

    Analyze or simulate aspheric surfaces and profiles for imaging systems, sensors and laser applications

    Shell CAD Compare Module

    Efficiently and easily compare measured Shell data (actual) with CAD models (nominal) or generated meshes

    Critical Dimensions & Trenches Module

    Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.



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