One analysis software solution for all your instrument data

Bring together data from multiple instruments

• Speed up analysis by using one single software program
• Ensure you are generating meaningful results from your data

Load live documents and analyses created by other Mountains® users (20,000+ community worldwide)

Process data from virtually any type of surface and image analysis instrument (50+ instrument manufacturers use Mountains®)

Process data from:

• 2D and 3D profilometers
• scanning electron microscopes (SEM)
• scanning probe microscopes (SPM) including atomic force microscopes (AFM)
• spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)

Load hundreds of file formats covering:

• profiles
• surfaces
• 3D (tomography) and 2D images
• multi-channel files
• force curves
• hyperspectral images
• multi-channel cubes etc.

• Perform correlative analysis quickly and easily
• Use the MountainsLab® colocalization feature to combine and overlay images and other data from different instruments
• Access advanced rendering options including image correction, color mixing and transparency to highlight image features

• Benefit from Digital Surf’s 30+ year expertise in surface metrology
• Use application-specific tools for analyzing surface texture
• Access advanced filters, parameters and other tools for profiles, surfaces and series of data

• Detect and quantify particles, pores, grains and other features of any shape and size on any surface and from any instrument
• Benefit from application-oriented segmentation techniques dedicated to your instrument type (profiler, SEM-SE, SEM-BSE, multi-channel data etc.)
• Group particles into classes based on characteristics
• Generate statistics and graphics (scatter plot, box plot, control chart, histogram etc.)

• Generate statistics for static or dynamic data populations
• Create statistics reports and let MountainsLab® detect and update data automatically
• Graphically display data by using control charts, histograms, scatter plots and more

• Automatically generate dimensions of profiles
• Compare profiles with CAD data in DXF format or user-defined nominal form
• Use tolerancing tools to apply pass/fail criteria
• Display form deviation graphically
• Export results in Excel-compatible format for quality management systems
• Process profiles with variable dimensions
• Perform Gothic Arch analysis

• Analyze force curves and force volume obtained by atomic force microscopes
• Automatically preprocess and denoise force curves, normalize baselines and calibrate cantilever sensitivity
• Visualize force curves: display single attract and/or retract curves and series of curves, select axis units
• Detect adhesion force adhesion events and calculate parameters, with manual fine tuning
• Apply Wormlike chain (WLC) models for protein unfolding
• Generate Young’s Modulus map
• Create statistics for series of force curves

• Visualize and analyze spectral maps from Raman, cathodoluminescence & photoluminescence techniques
• Visualize and analyze hyperspectral images
• Correlate data from spectroscopy with data and images from other instruments (AFM, SEM etc.) including topography data if available
• Load multi-channel cubes of compositional data (“chemical” cubes)
• Carry out particle analysis

Colorizing your SEM images can aid visualization and interpretation of the information they contain, as well as making them more aesthetically pleasing for publication
purposes.

• One click of the mouse is enough to color an object in your image.
• Objects are detected automatically. No need to create layers or play with transparency levels. MountainsLab® does the work for you.
• Use the same software for image processing & analysis. Once you’ve colorized your image in MountainsLab®, making objects easier to see, you have access to a comprehensive range of tools to carry out different types of analysis: 3D reconstruction, surface geometry analysis, surface roughness measurement

• Reconstruct heights from two successive tilted scans of your sample using stereo photogrammetry reconstruction algorithms
• Reconstruct heights from a four-image scan by a four-quadrant backscattered electron detector  using shape from shading algorithms
• Get approximate 3D rendering from a single image
• Access tools for roughness analysis and 3D dimensional analysis

• Access tutorials and ready-to-use templates adapted to each different instrument type (2D/3D profilometer, SEM, SPM, hyperspectral)
• Easily teach new colleagues about surface and image analysis routines using illustrated and commented templates