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What’s inside MountainsLab®

Data confluence
  • Bring together data from multiple instruments (profilometer, microscope)
  • Speed up analysis
  • Load any document created by other Mountains® users
  • Process data from virtually any type of surface and image analysis instrument
Compatible with any instrument
  • Process data from profilometers, scanning electron microscopes (SEM), scanning probe microscopes (SPM) and spectroscopic techniques
  • Load hundreds of file formats
Correlative analysis
  • Perform correlative analysis
  • Use the  colocalization feature to combine and overlay  data from different instruments
  • Access advanced rendering options
Surface texture analysis
  • Benefit from Digital Surf’s expertise in surface metrology
  • Analyze surface texture
  • Access advanced filters and parameters
Advanced particle analysis
  • Detect and quantify particles on any surface
  • Benefit from application-oriented segmentation techniques
  • Group particles into classes based on characteristics
  • Generate statistics and graphics
Generate statistics
  • Generate statistics for static or dynamic data populations
  • Create statistics reports
  • Let MountainsLab® detect and update data automatically
  • Graphically display data
Advanced contour analysis
  • Automatically generate dimensions of profiles
  • Compare profiles with CAD data or nominal form
  • Graphically display form deviations
Force spectroscopy
  • Analyze force curves and force volume
  • Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.
Data processing for spectroscopic techniques
  • Visualize and analyze spectral maps and hyperspectral images
  • Correlate data from spectroscopy with data and images from other instruments
  • Load multi-channel cubes of compositional data
  • Carry out particle analysis
SEM image colorization
  • Add color to objects in SEM images in just a few clicks
  • Automatic object detection
  • Save time compared with using photo editing software
3D SEM image reconstruction
  • Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector, all in a matter of seconds
Learn & teach
  • Access tutorials and ready-to-use templates adapted to each different instrument type
  • Teach new colleagues about surface and image analysis routines using templates

Select your product

MountainsLab® Premium MountainsLab® Expert

Compatibilité des instruments

All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes, spectrometer etc.

Correlative analysis

Particle and pore analysis

SEM image colorization & 3D reconstruction from stereo or quad SEM images

Statistical analysis of static and dynamic populations

Ultimate set of 2D/3D surface texture parameters and filters

Force curve and force volume analysis

Advanced contour analysis

Visualization, analysis and correlation of data obtained using spectroscopic techniques

Visualization & analysis of multi-channel cubes of compositional data

Shell (freeform surface) analysis

Thickness analysis, wear/deposit analysis

Fiber Analysis

Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsLab®.

Shell Extension Module

Freeform surface management, complex shape analysis, high quality 3D visualization

Shell Topography Module

A metrological toolbox for shell data (freeform surfaces)

IV Spectroscopy Module

3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)

Chemical Cubes Module

Full visualization & analysis of multi-channel cubes of compositional data

Spectroscopy Module

Visualize, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

Scale-sensitive Analysis Module

Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)

Force Curve Analysis Module

Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.

Lead Analysis (Twist) Module

2nd generation lead (twist) analysis for the automotive industry

Contour Analysis Module

Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

Advanced Contour Analysis Module

Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions

4D Surface Change Module

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Fourier & Wavelets Module

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

Thickness Analysis Module

Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles



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