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Newsletter

What’s inside MountainsSEM®

SEM image colorization & enhancement
  • “Click and color” tool for colorizing SEM images quickly and easily
  • Apply image correction and enhancement tools
3D reconstruction from stereo pairs
  • Reconstruct 3D surface topography from two successive tilted scans of your sample in just a few seconds and obtain accurate height values.
  • Obtain accurate height values and evaluate surface roughness.
3D reconstruction from 4 images

Reconstruct 3D surface topography from 4 images obtained using a four-quadrant detector.

Line edge roughness
  • Calculate line edge roughness (LER) and line width roughness (LWR) parameters on the edges of bands detected in SEM images
Create 3D chemical maps with EDS data

Build spectacular 3D renderings associating EDS (EDX) maps or other spectral/compositional data with topography reconstructed from SEM images

FIB-SEM tomography
  • Load, display and analyze focused ion beam scanning electron microscopy image series
  • Associate tomography and chemical analysis
2D particle analysis

Apply powerful particle analysis tools to your SEM data and automatically identify and quantify features in your image using SEM-specific object recognition.

Fiber Analysis
  • Quantify interstices & individual fibers, even if they overlap
  • Calculate diameter & orientation of fibers
  • Use SEM-dedicated fiber detection algorithms
Correlative analysis
  • Combine SEM images from different detectors or with data from other measurement instruments such as AFM or EDS (EDX)
  • Colocalize your SEM images with spectral analysis data

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    Select your product

    MountainsSEM® Premium

    MountainsSEM® Expert

    MountainsSEM® Color

    Instrument compatibility

    Any scanning electron microscope (SEM)

    Product features

    Quick SEM image colorization

    Basic analysis and measurement tools

    Image correction & enhancement tools

    Ultra-fast 3D reconstruction from 2 or 4 SEM images

    Instant 3D enhancement of single SEM images

    EDS/EDX map overlays on surface topography

    Optional modules

    Correlative Microscopy

    2D particle analysis & characterization

    Option Option

    Fiber Analysis

    Option Option

    FIB-SEM tomography cubes visualization & analysis

    Option

    Contour analysis

    Option Option

    Support for Shells (freeform surfaces)

    Option

    Advanced profile analysis

    Option Option

    Advanced Topography Analysis

    Option Option

    Fourier & wavelets analysis

    Option Option

    Spectroscopy

    Option Option

    Thickness Analysis

    Option Option

    4D Surface Change

    Option Option
    Included
    Option
    Available as an option
    Not compatible

    Recommended optional modules

    The following range of optional modules for advanced and specialized applications is available for MountainsSEM®.

    Chemical Cubes Module

    Full visualization & analysis of multi-channel cubes of compositional data

    Fiber Analysis Module

    Analyze fiber morphology including diameter & direction in SEM images (SE and BSE modes), light microscopy images and on topographical data.

    Critical Dimensions & Trenches Module

    Calculate critical dimensions and characterize line edge roughness / line width roughness in semiconductor fabrication processes.

    Shell Extension Module

    Freeform surface management, complex shape analysis, high quality 3D visualization

    Spectroscopy Module

    Visualize, process, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more

    Contour Analysis Module

    Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces

    Particle Analysis Module

    A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

    Advanced Topography Module

    Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis

    Thickness Analysis Module

    Global or zone-specific interactive thickness characterization based on a pair of surfaces or profiles

    Advanced Profile Module

    Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles

    Fourier & Wavelets Module

    FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets

    4D Surface Change Module

    Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

    Stories

    Testimonials

    What People Are Saying

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