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Different research and industrial projects require different tools and techniques. That's why we offer optional add-on modules for each of our products.
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis
Advanced profile filtering, fractal and Fourier analysis, statistical analysis of series of profiles
A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces
Automated statistics for multiple data populations, process capability
Analyze surface evolution with respect to time, temperature, magnetic field or another dimension
Basic geometric dimensioning & tolerancing of contour profiles and horizontal contours extracted from images
Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch
Lead Analysis (Twist)
2nd generation lead (twist) analysis for the automotive industry
Force Curve Analysis
Analyze data collected by force spectroscopy: force curves (force-distance curves), series of curves and force volume images (data cubes). Measure adhesion events, nanoindentation and fit worm-like chain (WLC) models.
3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization
Colocalize data from different instrument types and carry out correlative studies
Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques
Assess functional performance with a full set of 2D parameters developed by the automotive industry
Freeform surface management, complex shape analysis, high quality 3D visualization
Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)
Read AFM/SPM file formats, work with multi-channel SPM images, correct data acquisition errors
Fourier & Wavelets
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.