Advanced Topography

Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis

Advanced Profile

Advanced profile filtering, fractal and Fourier analysis, statistical analysis of series of profiles


Basic geometric dimensioning & tolerancing of contour profiles and horizontal contours extracted from images

Advanced Contour

Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch

Scale-Sensitive Analysis

Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)

Lead Analysis (Twist)

2nd generation lead (twist) analysis for the automotive industry


Assess functional performance with a full set of 2D parameters developed by the automotive industry


Automated statistics for multiple data populations, process capability

Fourier & Wavelets

FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets


Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.

4D Series

Analyze surface evolution with respect to time, temperature, magnetic field or another dimension

Force Curve Analysis

Analyze data collected by force spectroscopy: force curves (force-distance curves), series of curves and force volume images (data cubes). Measure adhesion events, nanoindentation and fit worm-like chain (WLC) models.


Colocalize data from different instrument types and carry out correlative studies

Particle analysis

A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces

Profiler extension

Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques

Shell extension

Freeform surface management, complex shape analysis, high quality 3D visualization

SEM Topography

3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization

SPM Extension

Read AFM/SPM file formats, work with multi-channel SPM images, correct data acquisition errors

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