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Optional modules
Different research and industrial projects require different tools and techniques. That's why we offer optional add-on modules for each of our products.
Advanced Topography Module
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis
Force Curve Analysis Module
Analyze force spectroscopy data: force curves (force-distance curves) and force volume. Measure adhesion events, nanoindentation and fit WLC models.
Particle Analysis Module
A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces
Chemical Cubes Module
Full visualization & analysis of multi-channel cubes of compositional data
IV Spectroscopy Module
3D visualization and analysis of IV spectroscopy images and individual IV curve analysis (including CITS data)
Advanced Profile Module
Advanced profile filtering, Fourier analysis, fractal analysis and statistical analysis of series of profiles
4D Series Module
Analyze surface evolution with respect to time, temperature, magnetic field or another dimension
Contour Analysis Module
Basic geometric dimensioning & tolerancing of contour profiles & horizontal contours extracted from images & surfaces
Advanced Contour Analysis Module
Advanced dimensioning and tolerancing, DXF CAD-compare, Gothic arch and other advanced functions
Colocalization Module
Colocalize data from different instrument types and carry out correlative studies
Lead Analysis (Twist) Module
2nd generation lead (twist) analysis for the automotive industry
Automotive Module
Assess functional performance with a full set of profile parameters developed by the automotive industry
Shell Extension Module
Freeform surface management, complex shape analysis, high quality 3D visualization
Shell Topography Module
A metrological toolbox for shell data (freeform surfaces)
Scale-sensitive Analysis Module
Multi-scale methods for analyzing geometric properties of surfaces and their scale derivatives (formerly in Sfrax software)
Spectroscopy Module
Visualize, analyze and correlate spectroscopic data: IR, Raman, TERS, EDS/EDX, XRF and more
Fourier & Wavelets Module
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
