Different research and industrial projects require different tools and techniques. That's why we offer optional add-on modules for each of our products.
Advanced studies, parameters & filters for 3D (“areal”) surface texture analysis
Advanced profile filtering, fractal and Fourier analysis, statistical analysis of series of profiles
Basic geometric dimensioning & tolerancing of contour profiles and horizontal contours extracted from images
Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch
Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)
Lead Analysis (Twist)
2nd generation lead (twist) analysis for the automotive industry
Assess functional performance with a full set of 2D parameters developed by the automotive industry
Automated statistics for multiple data populations, process capability
Fourier & Wavelets
FFT-based texture analysis, advanced FFT filtering, multi-scale analysis by wavelets
Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.
Analyze surface evolution with respect to time, temperature, magnetic field or another dimension
Force Curve Analysis
Analyze data collected by force spectroscopy: force curves (force-distance curves), series of curves and force volume images (data cubes). Measure adhesion events, nanoindentation and fit worm-like chain (WLC) models.
Colocalize data from different instrument types and carry out correlative studies
A comprehensive toolset for detecting and analyzing particles, pores, grains, islands etc. on structured surfaces
Profiler data management & analysis including distances and step heights measurement, basic ISO standard filters & filtering techniques
Freeform surface management, complex shape analysis, high quality 3D visualization
3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization
Read AFM/SPM file formats, work with multi-channel SPM images, correct data acquisition errors