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Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

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MountainsLab® for multi-instrument compatibility

Ultimate surface analysis suite and point of confluence for data from any kind of instrument, the ideal solution for labs working with multiple types of microscopes

MountainsMap® for Profilometry

Surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers

MountainsSEM® for Scanning Electron Microscopy

Visualization and analysis software for scanning electron microscopes (SEM) with tools for 3D reconstruction, colorization, particle analysis & FIB-SEM tomography

MountainsSPIP® for Scanning Probe Microscopy

Analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM) and STM, MFM, SNOM, CSAFM, KPFM, etc.

MountainsSpectral® for Spectroscopy

Data processing and correlative analysis software for spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)

MountainsImage® for Light Microscopy

Image visualization & analysis software for light microscopes and other imaging systems producing B&W or color images without topography

News

May 14, 2024

The new Mountains® 10.2 version has just been released. Check out what’s new in this release!

Event

04 September

We would be pleased to welcome you to our booth at the next JASIS exhibition in Tokyo from September 4 to 6.

Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989

Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.

Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 22,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.

Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.

Stories

AFM image analysis: determining surface quality of cap layers in superconductors

Researchers at the Institut de Ciència de Materials de Barcelona characterizied surface texture of superconductor materials with the aim of improving their performance.

Learn surface metrology

Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters

Blog

Demystifying AFM image analysis: a comprehensive guide

May 17, 2024

The goal of this article is to highlight AFM image processing methods and analysis techniques including particle analysis (grain analysis), roughness analysis and force curve analysis and examine their fields of application.