Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
SEM image colorization & enhancement
Colorize SEM images easily:
Learn more: wwww.digitalsurf.com/news/add-color-to-sem-images-in-only-a-few-steps/
Correct and enhance SEM images:
3D reconstruction from stereo pairs
Learn more: wwww.digitalsurf.com/blog/7-tips-for-producing-sem-stereo-pairs/
Reconstruct 3D surface topography from 4 images obtained using a four-quadrant detector.
3D reconstruction from 4 images
Learn more: wwww.digitalsurf.com/blog/using-a-four-quadrant-detector-in-3d-reconstruction/
Line edge roughness
Build spectacular 3D renderings associating EDS (EDX) maps or other spectral/compositional data with topography reconstructed from SEM images
Create 3D chemical maps with EDS data
Volume electron microscopy analysis
Apply powerful particle analysis tools to your SEM data and automatically identify and quantify features in your image using SEM-specific object recognition.
2D particle analysis
Fiber Analysis
Correlative analysis
Left: colocalization of an SEM image with AFM topography.
The following range of optional modules for advanced and specialized applications is available for MountainsSEM®.
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MountainsSEM® Premium |
MountainsSEM® Expert |
MountainsSEM® Image Analysis |
MountainsSEM® Color |
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Instrument compatibility |
Any scanning electron microscope (SEM) |
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Product features |
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Quick SEM image colorization |
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Basic analysis and measurement tools |
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Image correction & enhancement tools |
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EDS/EDX map overlays |
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Ultra-fast 3D reconstruction from 2 or 4 SEM images |
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Instant 3D enhancement of single SEM images |
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Optional modules |
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2D particle analysis & characterization |
Option | Option | ||
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Correlative Microscopy |
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Fiber Analysis |
Option | Option | Option | |
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Contour analysis |
Option | Option | Option | |
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Volume electron microscopy cube visualization & analysis |
Option | |||
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Support for Shells (freeform surfaces) |
Option | |||
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Critical Dimensions & Trenches |
Option | Option | Option | Option |
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Advanced profile analysis |
Option | Option | ||
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Advanced Topography Analysis |
Option | Option | ||
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Fourier & wavelets analysis |
Option | Option | ||
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Spectroscopy |
Option | Option | ||
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Thickness Analysis |
Option | Option | ||
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4D Surface Change |
Option | Option | ||
Click to see more
MountainsSEM® is specifically designed for the analysis of microstructural features, surface topography/morphology and compositional data from scanning electron microscopes (SEMs). It can handle SEM outputs such as secondary electron (SE) images, backscattered electron (BSE) images or EDS/EDX maps, and is compatible with all types of SEMs:
MountainsSEM® is also compatible with profilometers, scanning probe microscopes and other surface measurement systems, allowing correlative analyses across instruments.
Support for a wide range of generic file formats (TXT, CSV, TIFF, BMP, STL, etc.) ensures easy integration with both modern and legacy SEM systems, making MountainsSEM® a flexible solution for high-resolution surface analysis.
Click to see more
Digital Surf partners with many instrument manufacturers who offer MountainsSEM® under their own brand, either integrated with their instruments or as an optional add-on:
Instruments from non-partner manufacturers are also fully compatible, including those from Tescan, Coxem, Phenom-World (now part of Thermo Fisher) and others. With support for over 250 file formats, MountainsSEM® covers virtually all instruments on the market, past and present. Contact us to learn more.
Retrofit of older instruments
Some older scanning electron microscopes still offer solid performances but are held back by outdated software and incompatibility with modern Windows versions or current standards. By pairing them with MountainsSEM®, potentially on a separate PC running Windows 10 or 11, these instruments can be upgraded and continue delivering valuable results.