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Process & analyze spectra
Process spectral maps
Process & enhance images
Correlative Analysis
Left: colocalization of EDS maps, SEM image and AFM topography.
Visualize 2D compositional data in 3D
See composition of materials in full 3D
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MountainsSpectral® Premium |
MountainsSpectral® Expert |
MountainsSpectral® Correlate |
MountainsSpectral® Analyze |
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Instrument compatibility |
Spectroscopic techniques: Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF |
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Product features |
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Spectral map processing, enhancement & composition |
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Image correction & enhancement |
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Advanced processing & analysis of spectra |
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Topography analysis (i.e. based on AFM images) |
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High-quality overlays of compositional data on topography |
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Optional modules |
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Correlative Microscopy |
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Spectroscopy |
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Particle analysis |
Option | Option | ||
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Multi-channel (chemical) cubes visualization & analysis |
Option | Option | ||
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Fiber Analysis |
Option | Option | Option | |
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IV Spectroscopy |
Option | Option | ||
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Force Curve Analysis |
Option | Option | ||
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Critical Dimensions & Trenches |
Option | |||
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Support for Shells (freeform surfaces) |
Option | |||
The following range of optional modules for advanced and specialized applications is available with the MountainsSpectral® range.