One software program for all your measured data

Process data from any surface measuring instrument all in one place:
- SEM images including EDX/EDS data
- AFM & other SPM images
- Spectral data from Raman, fluorescence, IR, XPS, cathodoluminescence etc.
- 2D profiles or 3D surface heights
Learn more about Mountains® software key features in our video presentation:
See example applications:
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Correlating AFM, SEM & EDX data for nanoparticle analysisMountains® sofware used to combined measurements from several instrument techniques including AFM, SEM and EDX. |
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Exploring hyperspectral maps of 2D materialsHyperspectral maps and advanced principal component analysis (PCA) were performed with Mountains® software. |
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Analyzing photoelectron spectroscopic measurementsMountains® software combined with photoelectron spectroscopy to investigate a new method for growing PbS nanoplatelets on InP surfaces. |
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Characterizing the silicon dangling bondResearch scientists used Mountains® software to understand the electronic properties of silicon dangling bonds. |
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Failure analysis in optoelectronic devicesQuantitative CL technology coupled with Mountains® software makes it possible to identify degraded layers in green laser diodes. |
Resources
- Discover full features of MountainsLab® for multi-instrument compatibility
- About Digital Surf