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|MountainsLab® Premium||MountainsLab® Expert|
|Instrument compatibility||All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.|
|All available modules from across the Mountains® family range|
|Automotive parameters, advanced filters, parameters|
|Correction and enhancement of multilayer SPM data|
|Detection, analysis and classification of particles and pores on surface (topography) data|
|Dimensional measurements (step heights, distances etc.) on SPM data|
|Extensive range of 2D analysis & characterization tools for SEM images.|
|Force curve and force volume analysis and features|
|Image enhancement & correction|
|Instant 3D enhancement of single SEM images|
|Particle and pore analysis for surface and image data|
|Semi-automatic SEM image colorization|
|Statistical analysis of static and dynamic populations|
|Ultimate set of surface texture parameters|
|Ultra-fast 3D reconstruction from stereo or quad SEM images|
The following range of optional modules for advanced and specialized applications is available for MountainsLab® range.
Freeform surface management, complex shape analysis, high quality 3D visualization
Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.
Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)
For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.
Tailoring 2D semiconductor heterostructures with specific bandgaps is a key aspect of leveraging new quantum materials for electronics and optoelectronics, one of the hot topics for researchers currently working in nanotech. Craig Wall, applications scientist at Montana Instruments, recently investigated the subject using Mountains® software to analyze results from Raman spectroscopy and photoluminescence.
Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.
Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.
During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.
The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.
Senior Lecturer in Sensor Technology for Precision In-process Measurement, Cranfield University
Mountains® is able to read specific files from different instrument manufacturers meaning it allows us to compare the results within the same visual platform. We like how results are visualized and when it comes down to applying your operators, the software is intuitive.
Primary Lab Technician, Agfa-Gevaert
Superb software and great support!
In my opinion, Mountains® is the way to go if you want to raise the bar and get the most out of your topographic datasets.