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|MountainsLab® Premium||MountainsLab® Expert|
|Instrument compatibility||All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.|
|All available modules from across the Mountains® family range|
|Automotive parameters, advanced filters, parameters|
|Correction and enhancement of multilayer SPM data|
|Detection, analysis and classification of particles and pores on surface (topography) data|
|Dimensional measurements (step heights, distances etc.) on SPM data|
|Extensive range of 2D analysis & characterization tools for SEM images.|
|Force curve and force volume analysis and features|
|Image enhancement & correction|
|Instant 3D enhancement of single SEM images|
|Particle and pore analysis for surface and image data|
|Semi-automatic SEM image colorization|
|Statistical analysis of static and dynamic populations|
|Ultimate set of surface texture parameters|
|Ultra-fast 3D reconstruction from stereo or quad SEM images|
The following range of optional modules for advanced and specialized applications is available for MountainsLab® range.
Visualization & analysis of spectra & hyperspectral cubes obtained using Raman & IR spectrometers, CITS etc.
Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)