Data confluence & all the surface analysis tools you’ll ever need

The ideal solution for labs working with all types of microscopes and profilers, MountainsLab® software is the ultimate, industry-standard surface analysis suite and point of confluence for all your data. You can count on our team’s extensive expertise to ensure successful analysis, whatever your application.
The most comprehensive set of form and surface texture analyses - Particle and pore analysis - Statistical analysis of static and dynamic populations - Force curve and force volume analysis - Features for spectroscopy (Raman & IR spectrometers, CITS etc.) - Color and topography innovation for scanning electron microscopy – And much more

What’s inside MountainsLab®

Data confluence

Bring together data from multiple instruments, speed up analysis by using one single software program and ensure you are generating meaningful results from your data.

Compatible with any instrument

Process data from 2D and 3D profilometers, scanning electron microscopes (SEM), scanning probe microscopes (SPM)/atomic force microscopes (AFM) and spectrometers. Open hundreds of file formats covering profiles, surfaces, images, multi-channel files, force curves, hypercubes, etc.

Correlative analysis

Perform correlative analysis quickly and easily. Use the MountainsLab® colocalization feature to combine and overlay images and other data from different instruments.

Surface texture analysis

Use application-specific tools for analyzing surface texture. Access advanced filters, parameters and other tools for profiles, series of profiles and surfaces.

Advanced particle analysis

Detect and quantify particles, pores, grains and other image features of any shape and size on any surface and from any instrument. Group particles into classes based on characteristics and generate statistics.

Generate statistics

Generate statistics for static or dynamic data populations. Create statistics reports and let MountainsLab® detect and update data automatically. Display control charts, histograms, scatter plots and more.

Advanced contour analysis

Automatically generate dimensions of profiles, compare profiles with CAD data in DXF format or user-defined nominal form and graphically display form deviations.

Force spectroscopy

Analyze force curves and force volume. Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.

Raman & IR spectroscopy

Visualize & analyze spectra & hypercubes obtained using Raman & IR spectrometers, CITS etc.

SEM image colorization

Add color to objects in SEM images in just a few clicks. Automatic object detection. Save time compared with using photo editing software.

3D SEM image reconstruction

Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector. Get approximate 3D rendering from a single image. All in a matter of seconds.

Learn & teach

Access tutorials and ready-to-use templates adapted to each different instrument type. Easily teach new colleagues about surface and image analysis routines.

Benefits

Benefit from Digital Surf’s 30-year experience in surface analysis and metrology. Hundreds of research laboratories and institutes worldwide trust the power and precision of Mountains®.

Benefits

Become part of the global 15,000-strong community of Mountains® users and trust the analysis software chosen by the majority of leading manufacturers of microscopes and profilometers.

Benefits

Choose to work in your own language and get answers on using MountainsLab® from our responsive international support team.

Benefits

MountainsLab® handles your repetitive data analysis routines and includes many automation tools including templates.

Benefits

Organize your data and image analysis on multiple pages and publish directly in various formats (PDF, Word and Excel). It’s easy to share your work with colleagues, students, clients etc.

Benefits

Thanks to its unique analysis workflow, MountainsLab® makes it easy to track analysis steps applied to data. You can instantly revert back to any step and update it: all dependent steps will be recalculated automatically!

Select your product

	MountainsLab® Premium	MountainsLab® Expert
Instrument compatibility	All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.
All available modules from across the Mountains® family range
Automotive parameters, advanced filters, parameters
Correction and enhancement of multilayer SPM data
Detection, analysis and classification of particles and pores on surface (topography) data
Dimensional measurements (step heights, distances etc.) on SPM data
Extensive range of 2D analysis & characterization tools for SEM images.
Force curve and force volume analysis and features
Image enhancement & correction
Instant 3D enhancement of single SEM images
Particle and pore analysis for surface and image data
Semi-automatic SEM image colorization
Statistical analysis of static and dynamic populations
Ultimate set of surface texture parameters
Ultra-fast 3D reconstruction from stereo or quad SEM images

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Recommended optional modules

The following range of optional modules for advanced and specialized applications is available for MountainsLab^® range.

Shell extension

Freeform surface management, complex shape analysis, high quality 3D visualization

Scale-Sensitive Analysis

Implements a multi-scale analysis based on length-scale or area-scale analyses (formerly in Sfrax software)

SEM Topography

3D reconstruction from 2 or 4 SEM images, instant 3D enhancement of single SEM images & semi-automatic image colorization

Colocalization

Colocalize data from different instrument types and carry out correlative studies

Stories

Exploring hyperspectral maps of 2D materials

Tailoring 2D semiconductor heterostructures with specific bandgaps is a key aspect of leveraging new quantum materials for electronics and optoelectronics, one of the hot topics for researchers currently working in nanotech. Craig Wall, applications scientist at Montana Instruments, recently investigated the subject using Mountains® software to analyze results from Raman spectroscopy and photoluminescence.

Characterizing the silicon dangling bond

Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.

Testimonials

What People Are Saying

Dr Claudiu Giusca

Senior Lecturer in Sensor Technology for Precision In-process Measurement, Cranfield University

Mountains® is able to read specific files from different instrument manufacturers meaning it allows us to compare the results within the same visual platform. We like how results are visualized and when it comes down to applying your operators, the software is intuitive.

Peter Van Rompuy

Primary Lab Technician, Agfa-Gevaert

Superb software and great support!

In my opinion, Mountains® is the way to go if you want to raise the bar and get the most out of your topographic datasets.

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