What's inside?

Bring together data from multiple instruments, speed up analysis by using one single software program and ensure you are generating meaningful results from your data.
Process data from 2D and 3D profilometers, scanning electron microscopes (SEM), scanning probe microscopes (SPM)/atomic force microscopes (AFM) and spectrometers. Open hundreds of file formats covering profiles, surfaces, images, multi-channel files, force curves, hypercubes, etc.
Perform correlative analysis quickly and easily. Use the MountainsLab® colocalization feature to combine and overlay images and other data from different instruments.
Use application-specific tools for analyzing surface texture. Access advanced filters, parameters and other tools for profiles, series of profiles and surfaces.
Detect and quantify particles, pores, grains and other image features of any shape and size on any surface and from any instrument. Group particles into classes based on characteristics and generate statistics.
Generate statistics for static or dynamic data populations. Create statistics reports and let MountainsLab® detect and update data automatically. Display control charts, histograms, scatter plots and more.
Automatically generate dimensions of profiles, compare profiles with CAD data in DXF format or user-defined nominal form and graphically display form deviations.
Analyze force curves and force volume. Detect adhesion force, apply Wormlike chain (WLC) models for protein unfolding, generate Young’s Modulus map etc.
Visualize & analyze spectra & hypercubes obtained using Raman & IR spectrometers, CITS etc.
Add color to objects in SEM images in just a few clicks. Automatic object detection. Save time compared with using photo editing software.
Generate 3D surface topography from two successive tilted scans of your sample or 4 images scanned by a 4-quadrant detector. Get approximate 3D rendering from a single image. All in a matter of seconds.
Access tutorials and ready-to-use templates adapted to each different instrument type. Easily teach new colleagues about surface and image analysis routines.

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MountainsLab® Expert

Advanced surface imaging, analysis and metrology software capable of compiling and processing data from all types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.

  • Gives access to ultra-fast 3D reconstruction from stereo or quad SEM images, instant 3D enhancement of single SEM images, automatic SEM image colorization, enhancement & correction and an extensive range of 2D analysis & characterization tools for SEM images.
  • Includes tools for the correction and enhancement of multilayer SPM data, dimensional measurements (step heights, distances) and detection, analysis and classification of particles and pores.
  • Contains automotive parameters, advanced filters, parameters and other tools for profiles, series of profiles and surfaces including extraction of sub-surfaces, morphological filters, fractal analysis and more.

MountainsLab® Premium

Ultra-comprehensive surface imaging, analysis and metrology software capable of compiling and processing data from all types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc.

  • Includes all MountainsLab® Expert features and adds an ultimate set of surface texture parameters, particle and pore analysis, statistical analysis of static and dynamic populations, force curve and force volume analysis and features for spectroscopy (Raman & IR spectrometers, CITS etc.).
  • Also includes all available modules from across the Mountains® product range (except Lead analysis and scale-sensitive fractal analysis).

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