Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
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Instrument compatibility | All types of surface measuring and imaging instrument: 2D/3D profilometer, scanning electron microscopes, scanning probe microscopes etc. | |
All available modules from across the Mountains® family range | ||
Automotive parameters, advanced filters, parameters | ||
Correction and enhancement of multilayer SPM data | ||
Detection, analysis and classification of particles and pores on surface (topography) data | ||
Dimensional measurements (step heights, distances etc.) on SPM data | ||
Extensive range of 2D analysis & characterization tools for SEM images. | ||
Force curve and force volume analysis and features | ||
Image enhancement & correction | ||
Instant 3D enhancement of single SEM images | ||
Particle and pore analysis for surface and image data | ||
Semi-automatic SEM image colorization | ||
Statistical analysis of static and dynamic populations | ||
Ultimate set of surface texture parameters | ||
Ultra-fast 3D reconstruction from stereo or quad SEM images |
The following range of optional modules for advanced and specialized applications is available for MountainsLab® range.