MountainsMap® Example Applications

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Nanoscale carrier multiplication – spatial mapping

Multi-probe scanning tunneling microscope + MountainsMap® SPM software


Input Data

  • Multi-probe STM data.
  • Results

  • Spatial mapping of STM data layers including topography, tunneling current, electron current and hole current.
  • Calculation of quantum yield.
  • Mountains® tools used

  • 3D visualization and simultaneous manipulation of multi-layer SPM data files.
  • Math functions.


  • Image courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2014


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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