MountainsMap® Example Applications

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Nanoscale carrier multiplication – spatial mapping

Multi-probe scanning tunneling microscope + MountainsMap® SPM software

Input Data

  • Multi-probe STM data.
  • Results

  • Spatial mapping of STM data layers including topography, tunneling current, electron current and hole current.
  • Calculation of quantum yield.
  • Mountains® tools used

  • 3D visualization and simultaneous manipulation of multi-layer SPM data files.
  • Math functions.

  • Image courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2014

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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