MountainsMap® Example Applications



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Nanoscale carrier multiplication – spatial mapping

Multi-probe scanning tunneling microscope + MountainsMap® SPM software


Input Data

  • Multi-probe STM data.
  • Results

  • Spatial mapping of STM data layers including topography, tunneling current, electron current and hole current.
  • Calculation of quantum yield.
  • MountainsMap® tools used

  • 3D visualization and simultaneous manipulation of multi-layer SPM data files.
  • Math functions.


  • Image courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2014


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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