Scroll Up

Newsletter

Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

I agree to receive this newsletter and know that I can easily unsubscribe at any time.
Type the text you see :

Newsletter

Analyzing data from a large-scale multi-instrument project

The Institute of Electronics, Microelectronics and Nanotechnology (IEMN) in France recently completed the “Dirac III-V” project investigating ways of producing Dirac electrons (electrons without any mass). This project called for the use of many different fabrication methods as well as a software program capable of bringing together and processing the different kinds of datasets generated.

Correlating AFM, SEM & EDX data for nanoparticle analysis

For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.

Characterizing the silicon dangling bond

Bruno Grandidier, research scientist with the French National Center for Scientific Research (CNRS), reports on his work, focused on understanding the electronic properties of silicon dangling bonds.

Uncovering the huge potential of graphene oxide membranes

Recently, graphene oxide nanostructures have attracted great interest due to their exceptional physicochemical properties for many applications, including flexible electronics and water purification.

Bio-fuels research – fat stored in bacteria

During the last decade, research has shown that bio-oil fermentation by micro-organisms is a promising potential source of bio-fuel. Its renewability makes it a good alternative to bio-fuel production.

Analyzing roughness of glass subjected to acid attacks

The goal of the NanoRef programme, involving multiple partners (LP-Cnam, INM, LPUB, Institut Fresnel, Novasic and LNE), is to develop a roughness standard with a quasi-continuum spatial frequency spectrum and to define the appropriate machining and polishing processes.