MountainsMap® Example Applications



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Nanoparticles analysis – denoising a series of SEM images

SEM (scanning electron microscope) + MountainsMap® SEM software


Input Data

  • Series of SEM images captured at high speed.
  • Results

  • Colorized mean image has significantly higher quality than the images in the series.
  • Easier measurement of particle size.
  • MountainsMap® tools used

  • Colorization of SEM images.
  • Karhunen-Loève transform (principal component analysis) in 4D Analysis module.


  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Read more Surface Newsletter December 2012


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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