MountainsMap® Example Applications

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Nanoparticles analysis – denoising a series of SEM images

SEM (scanning electron microscope) + MountainsMap® SEM software

Input Data

  • Series of SEM images captured at high speed.
  • Results

  • Colorized mean image has significantly higher quality than the images in the series.
  • Easier measurement of particle size.
  • MountainsMap® tools used

  • Colorization of SEM images.
  • Karhunen-Loève transform (principal component analysis) in 4D Analysis module.

  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Read more Surface Newsletter December 2012

    List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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