MountainsMap® Example Applications

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Nanowires – sidewall morphology

STM (scanning tunneling microscope) + SEM (scanning electron microscope) +MountainsMap® SPM software + Colocalization module

Input Data

  • STM topography (x, y, z) and SEM image of Si nanowire.
  • Results

  • Overlay of SEM image on topography shows saw-tooth faceted sidewall of the Si nanowire.
  • Small Au clusters (barely seen on the SEM image and well resolved in STM) are predominantly found on the downward facets of the sidewall.
  • Mountains® tools used

  • Colocalization of microscope images and surface topography with overlays at selected transparency levels – using Colocalization module.

  • Images courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2011

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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