MountainsMap® Example Applications



Click on the arrows to display more applications.


Nanowires – sidewall morphology

STM (scanning tunneling microscope) + SEM (scanning electron microscope) +MountainsMap® SPM software + Colocalization module


Input Data

  • STM topography (x, y, z) and SEM image of Si nanowire.
  • Results

  • Overlay of SEM image on topography shows saw-tooth faceted sidewall of the Si nanowire.
  • Small Au clusters (barely seen on the SEM image and well resolved in STM) are predominantly found on the downward facets of the sidewall.
  • MountainsMap® tools used

  • Colocalization of microscope images and surface topography with overlays at selected transparency levels – using Colocalization module.


  • Images courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2011


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.