MountainsMap® Example Applications
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Nanowires – sidewall morphology
STM (scanning tunneling microscope) + SEM (scanning electron microscope) +MountainsMap® SPM software + Colocalization module
STM topography (x, y, z) and SEM image of Si nanowire.
Overlay of SEM image on topography shows saw-tooth faceted sidewall of the Si nanowire.
Small Au clusters (barely seen on the SEM image and well resolved in STM) are predominantly found on the downward facets of the sidewall.
MountainsMap® tools used
Colocalization of microscope images and surface topography with overlays at selected transparency levels – using Colocalization module.
Images courtesy of IEMN, Lille, France
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