MountainsMap® Example Applications

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Nanowires – sidewall morphology

STM (scanning tunneling microscope) + SEM (scanning electron microscope) +MountainsMap® SPM software + Colocalization module


Input Data

  • STM topography (x, y, z) and SEM image of Si nanowire.
  • Results

  • Overlay of SEM image on topography shows saw-tooth faceted sidewall of the Si nanowire.
  • Small Au clusters (barely seen on the SEM image and well resolved in STM) are predominantly found on the downward facets of the sidewall.
  • Mountains® tools used

  • Colocalization of microscope images and surface topography with overlays at selected transparency levels – using Colocalization module.


  • Images courtesy of IEMN, Lille, France

    Read more . . .

    Surface Newsletter November 2011


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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