MountainsMap® Example Applications

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Nanostructures – volume and other morphological parameters

AFM (atomic force microscope) + MountainsMap® SPM software


Input Data

  • AFM topography data.
  • Results

  • Visualization of 3D surface topography of nanostructures at any zoom level or angle.
  • Volume and other morphological parameters for each nanostructure.
  • Statistics for all nanostructures.
  • Mountains® tools used

  • Volume of islands in Grains & Particles module.


  • Images courtesy of ICMAB-CSIC

    Read more . . .

    Surface Newsletter April 2014


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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