MountainsMap® Example Applications



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Nanostructures – volume and other morphological parameters

AFM (atomic force microscope) + MountainsMap® SPM software


Input Data

  • AFM topography data.
  • Results

  • Visualization of 3D surface topography of nanostructures at any zoom level or angle.
  • Volume and other morphological parameters for each nanostructure.
  • Statistics for all nanostructures.
  • MountainsMap® tools used

  • Volume of islands in Grains & Particles module.


  • Images courtesy of ICMAB-CSIC

    Read more . . .

    Surface Newsletter April 2014


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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