MountainsMap® Example Applications



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MEMS contacts – inspection

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software


Input Data

  • Scan of surface topography (x, y, z).
  • Results

  • Visualization of anomaly on MEMS contact zone (including diameter and height).
  • MountainsMap® tools used

  • Visualization of 3D topography of extracted circular (or polygonal) zone.
  • Visualization of contour lines on surface.



  • List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.