MountainsMap® Example Applications

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MEMS contacts – inspection

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software

Input Data

  • Scan of surface topography (x, y, z).
  • Results

  • Visualization of anomaly on MEMS contact zone (including diameter and height).
  • MountainsMap® tools used

  • Visualization of 3D topography of extracted circular (or polygonal) zone.
  • Visualization of contour lines on surface.

  • List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

    Submit an application

    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.