MountainsMap® Example Applications

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Latex – wavelets multi-scale surface visualization and filtering

AFM (atomic force microscope) + MountainsMap® SPM software


Input Data

  • AFM topography of latex surface.
  • Results

  • Visualization of 3D surface topography at multiple scale levels.
  • Roughness & waviness surfaces with respect to user-selected cut-off scale.
  • Mountains® tools used

  • Discrete wavelets filter in the 3D Fourier & Wavelets Analysis module


  • Read more . . .

    Surface Newsletter September 2011


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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