MountainsMap® Example Applications

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Latex – wavelets multi-scale surface visualization and filtering

AFM (atomic force microscope) + MountainsMap® SPM software

Input Data

  • AFM topography of latex surface.
  • Results

  • Visualization of 3D surface topography at multiple scale levels.
  • Roughness & waviness surfaces with respect to user-selected cut-off scale.
  • Mountains® tools used

  • Discrete wavelets filter in the 3D Fourier & Wavelets Analysis module

  • Read more . . .

    Surface Newsletter September 2011

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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