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Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

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MountainsMap® for Profilometry

MountainsMap® is dedicated surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers.

MountainsSEM® for Scanning Electron Microscopy

MountainsSEM® is dedicated image enhancement, 3D reconstruction and metrology software for scanning electron microscopes (SEM) including tools for colorization and particle analysis.

MountainsSPIP® for Scanning Probe Microscopy

MountainsSPIP® is dedicated imaging and analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM), STM, MFM, SNOM, CSAFM, KPFM, etc.

MountainsLab® for multi-instrument compatibility

MountainsLab® software is the ultimate, industry-standard surface analysis suite and point of confluence for data from any kind of surface measuring instrument, the ideal solution for labs working with different types of microscopes and profilers.

News

December 8, 2020

We are thrilled to unveil the Mountains® 8.2 release, the latest version of our surface imaging, analysis and metrology software. Check out what’s inside.

Event

12 March

We would be pleased to welcome you to our virtual booth at the next Pittcon conference which will be held virtually from March 8 to 10, 2021.

Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989

Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.

Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 20,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.

Application areas include: automotive, material science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.

Stories

Correlating AFM, SEM & EDX data for nanoparticle analysis

For this application, a research team at the LNE Nanotech Institute combined measurements from several instrument techniques including Atomic Force Microscopy (AFM) and Scanning Electron Microscope (SEM) equipped with a new-generation energy dispersive X-ray detector (EDX). They used MountainsLab® software to correlate the collected data and extract the relevant information.

3D profilometry for quality control of pharmaceutical tablets

The profilometer manufacturer Nanovea conducted a study of different pharmaceutical tablets in order to study their surface roughness. With the use of a profilometer, they measured the average surface roughness of three different tablet surfaces. The data obtained was then analyzed with Nanovea’s Professional 3D software based on Mountains® technology.

Learn surface metrology

Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters

Blog

Is my surface stochastic or deterministic?

Stochastic and deterministic are two terms that are used more and more frequently to qualify modern surfaces. What is their meaning? Digital Surf’s senior metrology expert François Blateyron explains.