In this webinar, we’ll take a look at a few of the tools now offered by MountainsSEM® image analysis software for performing compositional analysis and morphological analysis on scanning electron microscopy images.
François will give a demonstration of the following features:
Overlaying chemical maps on topography
- How to build spectacular 3D renderings associating EDS (EDX) maps with topography reconstructed from SEM images in order to highlight surface properties & composition
Visualizing & analyzing FIB-SEM tomography
- How to load, display and analyze focused ion beam scanning electron microscopy image series as 3D voxel cubes to explore materials from the inside
Performing correlative analysis of SEM/AFM data
- How to combine SEM images with data from other measurement instruments (AFM/SPMs, 3D optical microscopes) for correlative analysis
Carrying out Particle Analysis
- How to study grains & particles
- Using Statistical tools
This webinar is available on demand and you can watch it by clicking on the link below.
Speaker: François Petiteau, Digital Surf
Duration: 30 minutes approx.
