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Mountains® allows you to analyze simple but also composite data obtained using a very wide range of surface analysis instruments & microscopes.

The following are some of the most common data types managed.

Topography and images from profilometers, optical profilers, microscopes etc.

 Data type Formula Description Suitable for… Example application Profile z=f(x) A profile is a measurement of heights along a line on a surface. The height Z is expressed according to a position X. Roughness Waviness Simple forms Roughness of sanded mold used for plastic injection Series of profiles z=f(x,t) Several profiles packed together as a single data set. Roughness or waviness changing over time Roughness or waviness parameters calculated on several profiles scanned at different positions or in different directions in order to increase the stability of parameter values. Tribology: successive stages of wear of a surface (2D cross section) Automotive: control of “orange peel” defect on painted body parts. Parametric profile (“contour”) (x,z) = f(t) The outer line of one or several objects. Contrary to the standard profile (in which only one side is studied), a parametric profile may contain overhangs and closed contours. Form analysis Comparison of shapes to CAD drawings (DXF) Control of mechanical components (bearings, cams, nozzles…) Surface z=f(x,y) A surface is a measurement of heights over a rectangular area of a surface. The height Z is expressed according to a position X,Y. Topography Calculation of the volume of material rejected by a laser impact Control of geometry in nanotechnologies Series of Surfaces z=f(x,y,t) Several surfaces packed together as a single data set. Surface change over time (wear, bow under a changing constraint) Wear: successive stages of a surface being worn, calculation of the missing volume (3D). Electronic packaging: study of chip carrier distortion when applying a heating cycle. Shell (Version 8.x) Meshes representing the outer shell of an object Outer texture of a 3D object Surface texture of a component that has no particular flat area Multiple-angle reconstruction of an object under the microscope in order to 3D print it Multilayer Image (z1,z2,…Zn) = f(x,y) Multiple signal analysis over a rectangular area Data from multi-channel microscopes, i.e. those which supply more than one value for each pixel (one of the channels is often the topography, i.e. map of Z heights, but this is not mandatory) Analyzing data from multi-channel scanning probe microscopes Locating proteins on the 3D topography representation of a material using the conductivity signal in addition to the height Image (R,G,B) = f(x,y) or G = f(x,y) A common image where each X,Y pixel has a “true” color (RGB) or possibly just the gray level (G) “True color” image or gray scale image Analysis of rust spots Counting objects Measuring nano-objects visible on SEM images Series of images (R,G,B) = f(x,y,t) A collection of images packed into a single data set An animated view of images In Mountains®, a series of images is often used for 3D reconstruction. This can be : a multi-focus image stack a multiple angle view for stereo reconstruction 4 4-quadrant SEM images. The result can then be studied as a surface-image data type (see below). Surface-Image (Z,R,G,B) = f(x,y) or (Z,G) = f(x,y) An association of a surface and an image packed into a single data set The image can be a true color image (RGB) or a gray level image (G) This is the standard type of data produced by most optical profilers supplying both the topography (Z height) and the image (RGB color) This allows 3D representations of the surface in its true original color (contrary to the “surface” data type above which contains only topography and for which only false-color may be added) All applications of topography, plus the ability to see the 3D surface in its true color Mountains® 3D-reconstruction of Scanning Electron Microscopy images (2D images) will supply images in 3D of this type. Binary Image b = f(x,y) ; b in {0,1} This is an image where each X,Y pixel has a binary information : pixel is a part of a particle or is part of the background Usually the result of applying a threshold to a gray level image or to a surface, in order to isolate objects from a background. Particle sorting and counting

AFM Force curve analysis

 Data type Description Force Curve Force Curves represent the deflection of the cantilever (used in Atomic Force Microscopy, AFM) according to its vertical distance from the sample. The measurement consists of two curves, the approach curve (blue) and the retract curve (red). Series of Force Curves A collection of force curves packed into a single data set Force-Volume A Force-Volume Studiable is a grid of equally spaced Force Curves. Each point in the image corresponds to a force curve that contains an approach and a retract curve. A Force Volume Studiable is a set of Force Curves that is considered as a single object.

Spectral  and hyperSpectral analysis

 Data type Formula Description Suitable for… Example application Spectrum Generated by a spectrometer. Peaks in the spectrum are detected automatically A spectrum generated by any type of spectrometer: Raman, FTIR, EDX… Mountains® offers advanced tools analyzing hyperspectral data, such as blind unmixing functions allowing dissociation of the original spectra from an image. Series of spectra A collection of the previous packed into a single data set Hyperspectral cube In a hyperspectral cube, each pixel in the image represents a full spectrum. The color of the pixel in a slice gives information about the intensity or amplitude of the spectrum at the given wavenumber. Raman, FTIR, EDX, Cathodoluminescence … or simply hyperspectral visible light cameras supplying hyperspectral cubes requiring analysis

What if my instrument data type is not listed above?

The above list contains data types available in currently released versions of Mountains®.