High quality imaging – improve image quality with image enhancement tools and denoising filters.

Computer-assisted coloring – colorize a SEM image in a few clicks thanks to the automatic object segmentation and produce high-quality color images for publications and posters. Create colored pseudo-3D views from SEM images.

Distance and angle measurement – measure objects within the image plane.

3D reconstruction – reconstruct 3D surfaces from stereo image pairs, anaglyphs and quads.

Anaglyphs – generate anaglyphs from 3D topography for viewing with stereoscopic glasses.

Profile (cross-section) extraction – from reconstructed 3D surfaces.

Contour dimensional analysis – of horizontal contours extracted from the XY plane and vertical contours (XZ profiles).

Subsurface analysis – extract and level planes on surfaces of microelectronic, micromechanical and other components.

Colocalization for correlative studies – colocalize different SEM images (for example a backscattered electron image with a secondary electron image) – colocalize SEM images with surface topography obtained by other microscopes or profilometers* – overlay images on 3D surface topography*. (* Availability of these functions depends upon what instrument file formats are supported by your software.)

MATLAB™ compatibility – load or write MATLAB™ scripts and execute them to carry out custom operations including filtering.

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