⇒ High quality imaging – improve image quality with image enhancement tools and denoising filters.
⇒ Computer-assisted coloring – colorize a SEM image in a few clicks thanks to the automatic object segmentation and produce high-quality color images for publications and posters. Create colored pseudo-3D views from SEM images.
⇒ Distance and angle measurement – measure objects within the image plane.
⇒ 3D reconstruction – reconstruct 3D surfaces from stereo image pairs, anaglyphs and quads.
⇒ Anaglyphs – generate anaglyphs from 3D topography for viewing with stereoscopic glasses.
⇒ Profile (cross-section) extraction – from reconstructed 3D surfaces.
⇒ Contour dimensional analysis – of horizontal contours extracted from the XY plane and vertical contours (XZ profiles).
⇒ Subsurface analysis – extract and level planes on surfaces of microelectronic, micromechanical and other components.
⇒ Colocalization for correlative studies – colocalize different SEM images (for example a backscattered electron image with a secondary electron image) – colocalize SEM images with surface topography obtained by other microscopes or profilometers* – overlay images on 3D surface topography*. (* Availability of these functions depends upon what instrument file formats are supported by your software.)
⇒ MATLAB™ compatibility – load or write MATLAB™ scripts and execute them to carry out custom operations including filtering.