MountainsMap® Premium

all-in-one surface imaging, analysis and metrology software superset for all types of surface imaging and measuring instrument

 30-day Free Trial

Product Information Sheet
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Why choose MountainsMap® Premium software?

Top of the line surface imaging, analysis and metrology software

MountainsMap® Premium software is a superset of all other MountainsMap┬« products. It is ready to use with the widest range of surface imaging, analysis and metrology instruments.

Advanced features included

The most powerful solution for surface imaging, analysis and metrology, MountainsMap® Premium includes all of the advanced surface analysis features that are available in optional modules for other MountainsMap┬« products. The only optional modules are for highly specialized applications.

All of the latest standards & methods

Working in MountainsMap® Premium's smart desktop publishing environment it is easy to turn your surface data into detailed visual surface analysis reports in accordance with all of the latest standards and methods.

Key features

Multiple imaging/metrology instrument compatibility

 Confocal microscopes
 Interferometric microscopes
 Structured light systems
 Scanning probe microscopes (STM, AFM, MFM, CSAFM, etc.)
 3D and 2D profilometers
 Form measuring systems
 Scanning electron microscopes *
 Hyperspectral spectrometers (Raman) *
 Other microscopes & surface imaging/metrology systems

(* requires optional module)

High quality 3D surface imaging, overlays & stitching

 High quality real time imaging of 3D surface topography.
 Animated flyover with AVI output.
 Overlays - overlay 3D optical profiler color images and intensity images on 3D surface topography to speed up detection of surface features - overlay any multi-channel scanning probe microscope (SPM) image layer (phase, current, etc.) on SPM 3D surface topography to correlate different kinds of surface data.
 Virtually increased field of view (stitching).
 Vertical range extension (patching) to overcome instrument limitations.
 Full set of smoothing and denoising filters.

Color image overlay on 3D topography from a confocal microscope.
(Image courtesy of Sensofar)

Current layer overlay on 3D topography from a CSAFM.
(Image courtesy of ICMAB-CSIC)

Statistical analysis of step heights on a physical standard.
(Image courtesy of LNE - French National Metrology Institute)

Powerful geometric, dimensional and form analysis

 Surface geometry (distances, angles, areas, volumes...).
 Geometric dimensioning (XY and XZ contour analysis)
 Comparison with nominal form (sphere, cylinder, plane...)
 ISO form deviation parameters (flatness, straightness...)
 Automatic partition of geometrical features

Full set of filters and surface texture parameters

 ISO 16610 filters: Gaussian, cubic spline, robust Gaussian
 ISO and national surface texture parameters from Ra to ISO 25178:
  • ISO 25178 areal field parameters (height, functional, spatial, hybrid)
  • ISO 25178 areal feature parameters (based upon segmentation)
  • ISO 25178 Volume parameters (Vmp, Vmc, Vvc and Vvv) with graphical plot.
  • ISO 4287 parameters on primary, roughness and waviness profile.
  • ISO 13565-2 parameters (Rk, Rpk, Rvk...) with graphical plot.
  • ISO 13565-3 parameters (Rpq, Rvq, Rmq).
  • ASME B46.1 areal and profile parameters.
  • GB/T (China), DIN (Germany), JIS (Japan, NF (France), BSI (UK), UNI (Italy), UNE (Spain) equivalents of ISO standards.

MountainsMap® Premium contains the most comprehensive set of areal and profile parameters, including the latest parameters defined in ISO 25178.

Numerous advanced features are standard in MountainsMap® Premium
including 3D and 2D Fourier analysis.

Advanced surface analysis

 3D and 2D FFT-based analysis of process-surface interactions including frequency spectrum and power spectrum density plots and studies of isotropy, directionality, periodicity, autocorrelation and intercorrelation.
 Grains, particles, islands and motifs (texture cells) analysis using multiple complementary methods.
 Multi-scale wavelets analysis for studing the scales at which phenomena occur and selecting the scales that correspond to the roughness and waviness surfaces.
 Sub-surface extraction and analysis (using a range of methods including segmentation by watersheds algorithms in accordance with ISO 25178), making it possible to analyse an extracted sub-surface in exactly the same way as a full surface.
 4D analysis of 3D surface evolution with respect to a 4th dimension (time, temperature, magnetic field, etc.) - movies of flights over changing surfaces - statistics - highlighting of areas of preponderant change (principal component analysis).  Automatic statistical analysis of multiple static or dynamic data populations, calculation of process capability parameters.

Fast, automated, traceable surface analysis report creation and statistics

 Smart desktop publishing user environment in ten languages (EN, FR, DE, ES, IT, PL, BR-PT, CN, JP, KR)
 Hierarchical analysis workflow shows all analysis steps, facilitates fine-tuning and ensures full metrological traceability.
 Pass/fail criteria can be specified for any parameter and green/red traffic lights are displayed automatically.
 Series of measurements can be analyzed automatically using templates and Minidocs (common sequences of analysis steps) can be saved in a library for insertion in future reports.
 Automated statistical analysis of multiple static and dynamic data populations and process capability evaluation.
 Comprehensive data export: PDF and RTF multi-page documents, screen and print quality bitmaps for conference poster sessions, Excel-compatible numerical results for post-processing with 3rd party tools.

Extracts from surface analysis reports showing multi-scale wavelets analysis, 4D analysis of 3D surface evolution with respect to time, and the flatness of an extracted (all standard in MountainsMap® Premium).

Correlative studies using colocalization

 Colocalize images obtained by scanning electron, fluorescence and other microscopes with surface topography data obtained by 3D optical profilers and scanning probe microscopes.
 Overlay microscope images on 3D surface topography.

Left. Colocalization of fluorescence image and surface topography of a cell obtained simultaneously by a fluorescence microscope and an atomic force microscope. Overlay of fluorescence image on 3D topography. (Images courtesy of Agilent Technologies.)

Optional modules

Advanced dimensioning and tolerancing, DXF CAD compare, Gothic arch
 Advanced Contour Analysis module

AFM force curve analysis, adhesion point detection, WLC models & statistics
 AFM Force Curves module

2nd generation lead (twist) analysis for the automotive industry
 Lead (Twist) module

SEM image enhancement and colored 3D intensity maps, reconstruction of 3D surfaces from 2 or 4 SEM images
 SEM Extension module

Use the Advanced Contour module to carry out dimensional analysis with tolerancing and to compare measured data with DXF CAD data.

Instrument compatibility

 MountainsMap® Premium inputs surface data in all instrument and generic file formats supported by Mountains Technology®. The range of supported file formats is subject to continuous evolution.
View the list of currently supported instruments and file formats
 Supported file formats