MountainsMap® Example Applications



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Microcomponents – measuring surface roughness of lithium niobate ridges

SEM (scanning electron microscope) + MountainsMap SEM software


Researchers at the FEMTO-ST Institute in Besançon, France studied methods for fabricating lithium niobate ridges to be used for the development of programmable microcomponents.

Using a scanning electron microscope they imaged ridge sides then reconstructed a 3D model of the zone with MountainsMap® SEM software.

Surface roughness (Sa) was then calculated.

Input Data

  • SEM images
  • MountainsMap® tools used

  • Stereo reconstruction operator
  • ISO 25178 height parameters


  • 3D reconstruction of ridge surface and parameters including roughness (Sa)
    Data courtesy of R. Salut & M. Raschetti, Femto-ST


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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