MountainsMap® Example Applications

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Nanostructures - correlative AFM and SEM imaging

AFM (atomic force microscope) + SEM (scanning electron microscope) + MountainsMap® Premium software

Input Data

  • AFM topography data and SEM image of nanostructures.
  • Results

  • Enhanced visualization of nanostructure and particle morphology.
  • MountainsMap® tools used

  • Colocalization of AFM and SEM images using the Colocalization module.
  • Overlay of SEM image on AFM 3D surface topography with user-selectable transparency.

  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Read more Surface Newsletter December 2012

    List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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