MountainsMap® Example Applications



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Nanostructures - correlative AFM and SEM imaging

AFM (atomic force microscope) + SEM (scanning electron microscope) + MountainsMap® Premium software


Input Data

  • AFM topography data and SEM image of nanostructures.
  • Results

  • Enhanced visualization of nanostructure and particle morphology.
  • MountainsMap® tools used

  • Colocalization of AFM and SEM images using the Colocalization module.
  • Overlay of SEM image on AFM 3D surface topography with user-selectable transparency.


  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Read more Surface Newsletter December 2012


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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