MountainsMap® Example Applications

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Nanostructures - correlative AFM and SEM imaging

AFM (atomic force microscope) + SEM (scanning electron microscope) + MountainsMap® Premium software

Input Data

  • AFM topography data and SEM image of nanostructures.
  • Results

  • Enhanced visualization of nanostructure and particle morphology.
  • Mountains® tools used

  • Colocalization of AFM and SEM images using the Colocalization module.
  • Overlay of SEM image on AFM 3D surface topography with user-selectable transparency.

  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Read more Surface Newsletter December 2012

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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