MountainsMap® Example Applications



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Automotive/surface texture engineering – looking to nature for inspiration

3D optical profiler + MountainsMap® Imaging Topography software


For this study, researchers used MountainsMap® to compare the load bearing characteristics of snakeskin from two different species with that of industrially honed cylinder liners.
Results showed several similarities between the two types of surface, opening up new possibilities for integrating features from the bio-surface studied into engineered surfaces.

Input Data

  • WLI interferograms of several regions of the surfaces studied (snakeskin & cylinder liner).
  • MountainsMap® tools used

  • Calculation of ISO 25178 surface texture parameters allowing quantitative comparison of surface features:
    - Average roughness (Sa)
    - Root mean square roughness (Sq)
    - Surface kurtosis (Sku)
    - Surface skewness (Ssk)
  • Abbott-Firestone Load curve allowing measurement of load-bearing characteristics of surfaces
  • Calculation of bearing ratio parameters characterizing the functional aspect of the surfaces studied:
    - Kernel roughness depth (Rk)
    - Peak roughness height (Rpk)
    - Valley roughness height (Rvk)


  • Courtesy of H. A. Abdel-Aal, University of North Carolina & M. El Mansori, Ecole Nationale Supérieure d’Arts et Métiers (Aix en Provence)

    Read more . . .

    iopscience.iop.org/2051-672X/1/1/015001
    iopscience.iop.org/2051-672X/2/4/045002
    www.ncbi.nlm.nih.gov/pubmed/23582565


    List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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