MountainsMap® Example Applications

Click on the arrows to display more applications.

Semiconductor wafer backgrinding – inspection & roughness

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software

Input Data

  • Low-force stylus scan (x, y, z) on zone of wafer after backgrinding.
  • Results

  • 3D view of zone showing vacuum hole shadow defects.
  • Surface roughness parameters (elevated because of defects).
  • Analysis of defect morphology.
  • Mountains® tools used

  • 3D view.
  • ISO 25178 height parameters.
  • Grains & Particles module for analyzing the vacuum holes.

  • List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

    Submit an application

    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.