MountainsMap® Example Applications

Click on the arrows to display more applications.

Semiconductor wafer backgrinding – inspection & roughness

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software


Input Data

  • Low-force stylus scan (x, y, z) on zone of wafer after backgrinding.
  • Results

  • 3D view of zone showing vacuum hole shadow defects.
  • Surface roughness parameters (elevated because of defects).
  • Analysis of defect morphology.
  • Mountains® tools used

  • 3D view.
  • ISO 25178 height parameters.
  • Grains & Particles module for analyzing the vacuum holes.



  • List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.