MountainsMap® Example Applications



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SIMS (secondary ion mass spectrometry) craters – 3D topography

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software


Input Data

  • Scan of SIMS craters topography (x, y, z) using low-force stylus.
  • Results

  • 3D view of SIMS craters.
  • Geometric analysis of step heights, distances and areas.
  • MountainsMap® tools used

  • 3D view.
  • Basic geometric analysis tools.



  • List of applications in gallery




    3D Optical
    Profilers


    3D Scanning
    Profilometers


    SPM


    SEM

    SEM (scanning electron microscope)



    Hyperspectral


    2D
    Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
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    Submitted applications will be published at Digital Surf's sole discretion.