MountainsMap® Example Applications
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SIMS (secondary ion mass spectrometry) craters – 3D topography
Scan of SIMS craters topography (x, y, z) using low-force stylus.
3D view of SIMS craters.
Geometric analysis of step heights, distances and areas.
MountainsMap® tools used
Basic geometric analysis tools.
List of applications in gallery
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If so then please send the following information to firstname.lastname@example.org
- Description of the application (purpose, context, results, etc.).
- Type of instrument used (make, model, settings).
- References of any related scientific papers.
- MountainsMap 7 document file(s) including original studiable.
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