MountainsMap® Example Applications

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SIMS (secondary ion mass spectrometry) craters – 3D topography

Low-force contact scanning profilometer + MountainsMap® Scanning Topography software

Input Data

  • Scan of SIMS craters topography (x, y, z) using low-force stylus.
  • Results

  • 3D view of SIMS craters.
  • Geometric analysis of step heights, distances and areas.
  • MountainsMap® tools used

  • 3D view.
  • Basic geometric analysis tools.

  • List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

    Submit an application

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