MountainsMap® Example Applications

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Reference standard, tin on carbon 200µm x 200µm - imaging

SEM (scanning electron microscope) + MountainsMap® SEM software

Input Data

  • 4x4 array of overlapping SEM images of a tin on carbon reference standard (supplied by Agar Scientific).
  • Results

  • Single image (grayscale or colorized with respect to grayscale) of the reference standard.
  • MountainsMap® tools used

  • Stitching.

  • Images courtesy of Agilent Technologies

    Read more . . .

    Surface Newsletter June 2014

    List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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