MountainsMap® Example Applications

Click on the arrows to display more applications.

Reference standard, tin on carbon 200µm x 200µm - imaging

SEM (scanning electron microscope) + MountainsMap® SEM software


Input Data

  • 4x4 array of overlapping SEM images of a tin on carbon reference standard (supplied by Agar Scientific).
  • Results

  • Single image (grayscale or colorized with respect to grayscale) of the reference standard.
  • Mountains® tools used

  • Stitching.


  • Images courtesy of Agilent Technologies

    Read more . . .

    Surface Newsletter June 2014


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.