MountainsMap® Example Applications

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Minerals – phase and basic compositional mapping

SEM (scanning electron microscope) BSE (back-scattered electron) detector + MountainsMap® SEM software


Input Data

  • BSE image of mineral surface requiring gray level drift correction.
  • Results

  • Color phase map of surface highlighting different minerals.
  • Mountains® tools used

  • Gray level drift correction using multi-plane form removal.


  • Read more . . .

    Surface Newsletter June 2014


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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