MountainsMap® Example Applications

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Magnetoelectric devices for spintronics – topography and density

AFM (atomic force microscope) + MountainsMap® SPM software

Input Data

  • AFM topography of contact zones on magnetoelectric devices produced using focused ion beam (FIB) lithography and self-organized gold nanostructures respectively.
  • Results

  • Visualization of 3D surface topography.
  • Comparison of contact zone density.
  • Mountains® tools used

  • 3D surface imaging at any angle and zoom level.
  • Profile extraction with horizontal distance and height difference measurement.

  • Images courtesy of ICMAB-CSIC

    Read more . . .

    Surface Newsletter November 2008

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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