MountainsMap® Example Applications

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Magnetoelectric devices for spintronics – topography and density

AFM (atomic force microscope) + MountainsMap® SPM software

Input Data

  • AFM topography of contact zones on magnetoelectric devices produced using focused ion beam (FIB) lithography and self-organized gold nanostructures respectively.
  • Results

  • Visualization of 3D surface topography.
  • Comparison of contact zone density.
  • MountainsMap® tools used

  • 3D surface imaging at any angle and zoom level.
  • Profile extraction with horizontal distance and height difference measurement.

  • Images courtesy of ICMAB-CSIC

    Read more . . .

    Surface Newsletter November 2008

    List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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