MountainsMap® Example Applications

Click on the arrows to display more applications.

Magnetoelectric devices for spintronics – topography and density

AFM (atomic force microscope) + MountainsMap® SPM software


Input Data

  • AFM topography of contact zones on magnetoelectric devices produced using focused ion beam (FIB) lithography and self-organized gold nanostructures respectively.
  • Results

  • Visualization of 3D surface topography.
  • Comparison of contact zone density.
  • Mountains® tools used

  • 3D surface imaging at any angle and zoom level.
  • Profile extraction with horizontal distance and height difference measurement.


  • Images courtesy of ICMAB-CSIC

    Read more . . .

    Surface Newsletter November 2008


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.