MountainsMap® Example Applications

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MEMS layers – flatness and roughness

3D optical profiler + MountainsMap® Imaging Topography software


Input Data

  • Topography (x, y, z) of MEMS.
  • Results

  • 3D surface topography of MEMS and extracted layer.
  • Calculation of flatness and roughness parameters for the extracted layer only.
  • Mountains® tools used

  • Partition & level and calculation of ISO 12781 flatness parameters in 3D Advanced Surface Texture module. module.
  • Calculation of ISO 25178 height parameters.



  • List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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    Do you want to share one of your MountainsMap 7 applications?
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    Submitted applications will be published at Digital Surf's sole discretion.