MountainsMap® Example Applications

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LED lens – assembly of measurements made at different heights

3D scanning profilometer + MountainsMap® Scanning Topography software


Input Data

  • Two scans (x, y, z) of lens surface at different heights.
  • Results

  • 3D surface topography of lens constructed by patching together the two scans.
  • Surface ready for geometric and surface texture analysis.
  • Mountains® tools used

  • Surface patching.



  • List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
    Sending an application does not guarantee that it will be published.
    Submitted applications will be published at Digital Surf's sole discretion.