MountainsMap® Example Applications

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LED lens – assembly of measurements made at different heights

3D scanning profilometer + MountainsMap® Scanning Topography software

Input Data

  • Two scans (x, y, z) of lens surface at different heights.
  • Results

  • 3D surface topography of lens constructed by patching together the two scans.
  • Surface ready for geometric and surface texture analysis.
  • MountainsMap® tools used

  • Surface patching.

  • List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

    Submit an application

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