MountainsMap® Example Applications

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Graphene – step height measurement on bilayer graphene sheet

AFM (atomic force microscope) MountainsMap® SPM software

Input Data

  • SEM topography (x, y, z) of exfoliated graphene sheets on a silicon oxide substrate (20µm x 20 µm).
  • Results

  • Measurement of step height on graphene bilayer.
  • Mountains® tools used

  • Advanced filtering techniques including FFT editor and partitioning using segmentations by watersheds (available in the 3D Advanced Surface Texture module).

  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Surface Newsletter December 2009

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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