MountainsMap® Example Applications

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Graphene – step height measurement on bilayer graphene sheet

AFM (atomic force microscope) MountainsMap® SPM software

Input Data

  • SEM topography (x, y, z) of exfoliated graphene sheets on a silicon oxide substrate (20µm x 20 µm).
  • Results

  • Measurement of step height on graphene bilayer.
  • MountainsMap® tools used

  • Advanced filtering techniques including FFT editor and partitioning using segmentations by watersheds (available in the 3D Advanced Surface Texture module).

  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Surface Newsletter December 2009

    List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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