MountainsMap® Example Applications
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Graphene – step height measurement on bilayer graphene sheet
AFM (atomic force microscope) MountainsMap® SPM software
SEM topography (x, y, z) of exfoliated graphene sheets on a silicon oxide substrate (20µm x 20 µm).
Measurement of step height on graphene bilayer.
Mountains® tools used
Advanced filtering techniques including FFT editor and partitioning using segmentations by watersheds (available in the 3D Advanced Surface Texture module).
Images courtesy of LNE (French National Metrology Institute)
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