MountainsMap® Example Applications

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Graphene – step height measurement on bilayer graphene sheet

AFM (atomic force microscope) MountainsMap® SPM software


Input Data

  • SEM topography (x, y, z) of exfoliated graphene sheets on a silicon oxide substrate (20µm x 20 µm).
  • Results

  • Measurement of step height on graphene bilayer.
  • Mountains® tools used

  • Advanced filtering techniques including FFT editor and partitioning using segmentations by watersheds (available in the 3D Advanced Surface Texture module).


  • Images courtesy of LNE (French National Metrology Institute)

    Read more . . .

    Surface Newsletter December 2009


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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