MountainsMap® Example Applications

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Electronic component layers – flatness

AFM (atomic force microscope) + MountainsMap® SPM

Input Data

  • Raw AFM image of circuit.
  • Results

  • 3D visualization of extracted leveled layer.
  • Flatness parameters for extracted layer only.
  • Mountains® tools used

  • Partition & level and ISO 12781 Flatness parameters in 3D Advanced Surface Texture module.

  • List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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