MountainsMap® Example Applications

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Electronic component layers – flatness

AFM (atomic force microscope) + MountainsMap® SPM

Input Data

  • Raw AFM image of circuit.
  • Results

  • 3D visualization of extracted leveled layer.
  • Flatness parameters for extracted layer only.
  • MountainsMap® tools used

  • Partition & level and ISO 12781 Flatness parameters in 3D Advanced Surface Texture module.

  • List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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