MountainsMap® Example Applications

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Diffraction networks for optical systems – 3D topography & step heights

SEM (scanning electron microscope) + MountainsMap® SEM software

Input Data

  • 4 SEM images of an optical diffraction network obtained by a 4 quadrant detector.
  • Results

  • Visualization of 3D surface topography at any zoom level or angle.
  • Step height values.
  • Mountains® tools used

  • 3D reconstruction from 4 SEM images.
  • Cross-section (profile) extraction.
  • Step height analysis.

  • Images courtesy of Synergie4, Evry, France.

    Read more . . .

    Surface Newsletter November 2013

    List of applications in gallery

    3D Optical

    3D Optical Profilers

    3D Scanning

    3D Scanning Profilometers


    AFM (atomic force microscope)


    SEM (scanning electron microscope)


    Hyperspectal microscopes


    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

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