MountainsMap® Example Applications

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Diffraction networks for optical systems – 3D topography & step heights

SEM (scanning electron microscope) + MountainsMap® SEM software


Input Data

  • 4 SEM images of an optical diffraction network obtained by a 4 quadrant detector.
  • Results

  • Visualization of 3D surface topography at any zoom level or angle.
  • Step height values.
  • Mountains® tools used

  • 3D reconstruction from 4 SEM images.
  • Cross-section (profile) extraction.
  • Step height analysis.


  • Images courtesy of Synergie4, Evry, France.

    Read more . . .

    Surface Newsletter November 2013


    List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



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