MountainsMap® Example Applications

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Abrasives – quality control, characterization of different grades

3D scanning profilometer +MountainsMap® Scanning Topography software


Input Data

  • Surface topography (x, y, z) of samples of two grades of abrasive.
  • Results

  • 3D visualization of both sample surfaces including grains.
  • Comparison of surface texture of the samples.
  • Mountains® tools used

  • Peak count distribution histograms.
  • Calculation of ISO 25178 areal surface texture parameters.
  • Grains & Particles module for advanced applications.



  • List of applications in gallery




    3D Optical
    Profilers

    3D Optical Profilers



    3D Scanning
    Profilometers

    3D Scanning Profilometers



    SPM

    AFM (atomic force microscope)



    SEM

    SEM (scanning electron microscope)



    Hyperspectral

    Hyperspectal microscopes



    2D
    Profilometers

    2D Profilometers

    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope



    Submit an application


    Do you want to share one of your MountainsMap 7 applications?
    If so then please send the following information to applications@digitalsurf.com : Note:
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    Submitted applications will be published at Digital Surf's sole discretion.