MountainsMap® Example Applications

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Abrasives – quality control, characterization of different grades

3D scanning profilometer +MountainsMap® Scanning Topography software

Input Data

  • Surface topography (x, y, z) of samples of two grades of abrasive.
  • Results

  • 3D visualization of both sample surfaces including grains.
  • Comparison of surface texture of the samples.
  • MountainsMap® tools used

  • Peak count distribution histograms.
  • Calculation of ISO 25178 areal surface texture parameters.
  • Grains & Particles module for advanced applications.

  • List of applications in gallery

    3D Optical

    3D Scanning



    SEM (scanning electron microscope)



    Correlative Studies

    3D Optical Profiler + SEM (scanning electron microscope)

    AFM-IR (atomic force microscope with tunable pulsed infrared source)

    STM (scanning tunneling microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + SEM (scanning electron microscope)

    AFM (atomic force microscope) + fluorescence microscope

    Submit an application

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